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Browsing by Author "Beckers, Arnout"

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    A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays

    Grill, Alexander  
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    Michl, J.
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    Diaz Fortuny, Javier  
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    Beckers, Arnout  
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    Bury, Erik  
    Proceedings paper
    2023, 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), MAR 07-10, 2023
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    Cold CMOS for Sustainable Datacenters

    Beckers, Arnout  
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    Grill, Alexander  
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    Sharma, Arvind  
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    Van de Put, Maarten  
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    Garcia Bardon, Marie  
    Proceedings paper
    2024, 50th IEEE European Solid-State Electronics Research Conference (ESSERC), SEP 09-12, 2024, p.229-232
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    Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study

    Prasad, Divya
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    Vangala, Manoj
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    Bhargava, Mudit
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    Beckers, Arnout  
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    Grill, Alexander  
    Proceedings paper
    2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022
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    Energy filtering in silicon nanowires with a geometric superlattice for steep-slope transistors

    Beckers, Arnout  
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    Thewissen, Maarten
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    Soree, Bart  
    Journal article
    2018, Journal of Applied Physics, (124) 14, p.144304
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    Gate oxide reliability: upcoming trends, challenges, and opportunities

    Kaczer, Ben  
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    Degraeve, Robin  
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    Franco, Jacopo  
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    Grasser, T.
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    Roussel, Philippe  
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    Bury, Erik  
    Proceedings paper
    2024, IEEE Silicon Nanoelectronics Workshop (SNW) / Symposium on VLSI Technology and Circuits, 2024-06-15, p.3-4
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    Generalized Boltzmann relations in semiconductors including band tails

    Beckers, Arnout
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    Beckers, Dominique
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    Jazaeri, Farzan
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    Parvais, Bertrand  
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    Enz, Christian
    Journal article
    2021, JOURNAL OF APPLIED PHYSICS, (129) 4, p.Art. 045701
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    New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications

    Asanovski, R.
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    Grill, Alexander  
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    Franco, Jacopo  
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    Palestri, P.
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    Beckers, Arnout  
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    Kaczer, Ben  
    Proceedings paper
    2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022
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    Physical model of low-temperature to cryogenic threshold voltage in MOSFETs

    Beckers, Arnout  
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    Jaezeri, Farzan
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    Grill, Alexander  
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    Narasimhamoorthy, Subramanian  
    Journal article
    2020, IEEE Journal of the Electron Devices Society, 8, p.780-788
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    Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing

    Beckers, Arnout  
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    Michl, Jakob
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    Grill, Alexander  
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    Kaczer, Ben  
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    Garcia Bardon, Marie  
    Journal article
    2023, IEEE TRANSACTIONS ON NANOTECHNOLOGY, 22, p.590-596
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    Subthreshold swing behavior in amorphous indium-gallium-zinc-oxide transistors from room to cryogenic temperatures

    Tang, Hongwei  
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    Belmonte, Attilio  
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    Lin, Dennis  
    ;
    Zhao, Ying  
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    Beckers, Arnout  
    ;
    Verdonck, Patrick  
    Journal article
    2025-JUN 9, APPLIED PHYSICS LETTERS, (126) 23, p.232108-1-232108-6
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    Temperature Dependence of Quasi-Ballistic Transport in n-Type and p-Type Nanosheets

    Bufler, Fabian  
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    Vermeersch, Bjorn  
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    Mishra, Subrat  
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    Beckers, Arnout  
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    Ritzenthaler, Romain  
    Proceedings paper
    2024, Latin American Electron Devices Conference (LAEDC), 2024-05-08
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    Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors

    Grill, Alexander  
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    John, Valentin  
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    Michl, J.
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    Beckers, Arnout  
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    Bury, Erik  
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    Tyaginov, Stanislav  
    Proceedings paper
    2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022
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    The Effect of Resonant Tunneling on Random Telegraph Noise in the Cryogenic Regime

    Grill, Alexander  
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    Michl, J.
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    Beckers, Arnout  
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    Catapano, Edoardo  
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    Waldhoer, D.
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    Tselios, K.
    Proceedings paper
    2024, 2024 International Integrated Reliability Workshop-IIRW-Annual, 2024-10-06
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    Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

    Asanovski, Ruben
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    Grill, Alexander  
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    Franco, Jacopo  
    ;
    Palestri, Pierpaolo
    ;
    Beckers, Arnout  
    Journal article
    2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 4, p.2135-2141

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