Browsing by Author "Beckers, Arnout"
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Publication A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Proceedings paper2023, 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), MAR 07-10, 2023Publication Cold CMOS for Sustainable Datacenters
Proceedings paper2024, 50th IEEE European Solid-State Electronics Research Conference (ESSERC), SEP 09-12, 2024, p.229-232Publication Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication Energy filtering in silicon nanowires with a geometric superlattice for steep-slope transistors
Journal article2018, Journal of Applied Physics, (124) 14, p.144304Publication Gate oxide reliability: upcoming trends, challenges, and opportunities
Proceedings paper2024, IEEE Silicon Nanoelectronics Workshop (SNW) / Symposium on VLSI Technology and Circuits, 2024-06-15, p.3-4Publication Generalized Boltzmann relations in semiconductors including band tails
Journal article2021, JOURNAL OF APPLIED PHYSICS, (129) 4, p.Art. 045701Publication New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication Physical model of low-temperature to cryogenic threshold voltage in MOSFETs
Journal article2020, IEEE Journal of the Electron Devices Society, 8, p.780-788Publication Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Journal article2023, IEEE TRANSACTIONS ON NANOTECHNOLOGY, 22, p.590-596Publication Subthreshold swing behavior in amorphous indium-gallium-zinc-oxide transistors from room to cryogenic temperatures
Journal article2025-JUN 9, APPLIED PHYSICS LETTERS, (126) 23, p.232108-1-232108-6Publication Temperature Dependence of Quasi-Ballistic Transport in n-Type and p-Type Nanosheets
Proceedings paper2024, Latin American Electron Devices Conference (LAEDC), 2024-05-08Publication Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
Proceedings paper2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022Publication The Effect of Resonant Tunneling on Random Telegraph Noise in the Cryogenic Regime
Proceedings paper2024, 2024 International Integrated Reliability Workshop-IIRW-Annual, 2024-10-06Publication Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 4, p.2135-2141