Browsing by Author "Boggild, Peter"
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Publication Case studies of electrical characterisation of graphene by terahertz time-domain spectroscopy
Publication Electrical characterization of InGaAs ultra-shallow junctions
Proceedings paper2009, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 26/04/2009Publication Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Publication Review of electrical characterization of ultra-shallow junctions with micro four-point probes