Browsing by Author "Borgarino, M."
Now showing 1 - 7 of 7
- Results Per Page
- Sort Options
Publication Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs
Publication Modelling of low-frequency dispersive effects in GaAs and InP HEMTs
Publication On the correlation between drain-gate breakdown voltage and hot-electron reliability in InP HEMT's
Journal article1999, IEEE Electron Device Letters, (20) 4, p.152-154Publication On the effects of hot electrons on the DC and RF characteristics of lattice-matched InAlAs/InGaAs/InP HEMT's
Publication Reliability testing of InP HEMT's using electrical stress methods
Journal article1999, IEEE Trans. Electron Devices, (46) 8, p.1570-1576Publication The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs
Publication The effect of passivation on the hot electron degradation of lattice-matched InAlAs/InGaAs/InP HEMTs