Browsing by Author "Bosman, Michel"

Controlling the Wet-Etch Directionality in Nanostructured Silicon

Patterning at the Resolution Limit of Commercial Electron Beam Lithography

Physical analysis of beakdown in High-k /metal gate stacks using TEM/EELS and STM for relibaility enhancement

Random telegraph noise reduction in metal gate high-k stacks by bipolar switching and the performance boosting technique

Very low reset current for an RRAM device achieved in the oxygen-vacancy-controlled regime