Browsing by Author "Canato, Eleonora"
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Publication Degradation of GaN-HEMTs with p-GaN Gate: Dependence on temperature and on geometry
Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.4B-5.1-4B-5.5Publication Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs
Publication Threshold voltage instability mechanisms in p-GaN gate AlGaN/GaN HEMTs
Proceedings paper2019, 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD), 19/05/2019, p.287-289