Browsing by Author "Celano, Umberto"
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Publication 3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors
Proceedings paper2019, IEEE International Electron Devices Meeting - IEDM 2019, 7/12/2019, p.238-241Publication A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Meeting abstract2015, 2015 MRS Fall Meeting symposium UU:, 29/11/2015, p.UU8.05Publication A comprehensive variability study of doped HfO2 FeFET for memory applications
Proceedings paper2022, 14th IEEE International Memory Workshop (IMW), MAR 15-18, 2022, p.85-88Publication Accessing electronic properties of two-dimensional materials with gate-dependent micro four-point probe
Journal article2025-JAN 1, 2D MATERIALS, (12) 1Publication Advanced characterization methods for HfO2/ZrO2-based ferroelectrics
Editorial material2023, 5, p.Art. 1114267Publication Advantages of high vacuum for electrical scanning probe microscopy
Journal article2019, Compound Semiconductor, p.June 6thPublication Advantages of high vacuum for electrical scanning probe microscopy
Journal article2019, NanoScientific, SummerPublication All-nanocellulose nonvolatile resistive memory
Journal article2016, NPG Asia Materials, (8) 9, p.e310Publication An innovative probe microscopy solution for measuring conductivity profiles in 3-dimensions
Proceedings paper2021, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, 22/02/2021, p.116110JPublication Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices
Journal article2015, IEEE Transactions on Electron Devices, (62) 6, p.2007-2013Publication Atomically-thin tunable zone plate lens
Proceedings paper2019, META 2019, the 10th International Conference on Metamaterials, Photonic Crystals and Plasmonics, 23/07/2019Publication Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Journal article2020, Park Systems.com: Application Note #54, p.1-5Publication Carrier profiling with Fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP
Journal article2019, Ultramicroscopy, 206, p.112809Publication Carrier type dependence on spatial asymmetry of unipolar resistive switching of metal oxides
Journal article2013, Applied Physics Letters, (103) 17, p.173506Publication Cellulose nanofiber paper as an ultra flexible nonvolatile memory
Journal article2014, Scientific Reports, 4, p.5532Publication Cellulose nanofibers for resistive switching: toward a paper-based electronics
Proceedings paper2014, E-MRS Spring Meeting Symposium S: Memristormaterials, Mechanisms and Devices for Unconventional Computing, 26/05/2014Publication Characterization of grain boundaries and impact of plasma-induced patterned in 2D materials
Oral presentation2017, Material Reserach Society Spring MeetingPublication Circuit delay and power benchmark of graphene against Cu interconnects
Proceedings paper2019, IEEE International Interconnect Technology Conference (IITC 2019) and Materials for Advanced Metallization Conference (MAM 2019), 3/06/2019, p.3.3