Browsing by Author "Chang, Hao"
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Publication Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Proceedings paper2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021Publication Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Publication Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress
; Yin, HuaxiangProceedings paper2020, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), JUL 20-23, 2020