Browsing by Author "Chang, M.H."

Damaging species in the hole injection induced electron trap generation

Dominant layer for stress-induced positive charges in Hf-based gate stacks

Effects of measurement temperature on NBTI

Impact of different defects on the kinetics of Negative Bias Temperature Instability of Hafnium stacks

Instability and defects in gate dielectric: similarity and differences between Hf-stacks and SiO2

On the activation and passivation of precursors for process-induced positive charges in Hf-dielectric stacks

Process-induced positive charges in Hf-based gate stacks