Browsing by Author "Chen, Hua"
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Publication Gate metal and cap layer effects on Ge nMOSFETs low frequency noise behavior
Journal article2019-12, IEEE Transactions on Electron Devices, (66) 2, p.1050-1056Publication Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursors
; Publication RTS Noise Characterization of Trap Properties in InGaAs nFinFETs
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 7, p.3496-3503