Browsing by Author "Chen, Hua"

Now showing 1 - 4 of 4

Gate metal and cap layer effects on Ge nMOSFETs low frequency noise behavior

He, Liang
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Zhao, Pan
;
Liu, Jiahao
;
Su, Yahui
;
Chen, Hua
;
Jia, Xiaofei
;
Arimura, Hiroaki
Journal article
2019, IEEE Transactions on Electron Devices, (66) 2, p.1050-1056
InF₃ SurfacePassivation on InAs QuantumDots Enhances Photoluminescence and Reduces Trap-Induced Dark Currentin Shortwave Infrared Photodetectors

Chen, Hua
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Claus, Boris B.
;
Song, Wenya
;
Vildanova, Marina
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van der Poll, Lara M.
;
van Aken, Anne
Journal article
2026, ACS NANO, (20) 34, p.23822-23836
Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursors

He, Liang
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Simoen, Eddy
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Claeys, Cor
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Wang, Guilei
;
Luo, Jun
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Zhao, Chao
;
Li, Junfeng
;
Chen, Hua
;
Hu, Yin
Proceedings paper
2017, China Semiconductor Technology International Conference - CSTIC, 12/03/2017
RTS Noise Characterization of Trap Properties in InGaAs nFinFETs

Xiao, Xiaolei
;
He, Liang
;
Chen, Hua
;
Wang, Xianyu
;
Simoen, Eddy
;
Claeys, Cor
Journal article
2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 7, p.3496-3503