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Browsing by Author "Chen, J.D."

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    High performance & CMOS integration friendly dual metal gate MOSFETs using TaN/Ru or TaN/W/Ru stacking multi-layers on HfLaO gate dielectric

    Wang, X.P.
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    Li, M.F.
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    Yu, HongYu
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    Yang, J.J.
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    Loh, W.Y.
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    Zhu, C.X.
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    Du, A.Y.
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    Trigg, A.D.
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    Zhang, G.
    Proceedings paper
    2007, International Conference on Solid State Devices and Materials - SSDM, 18/09/2006
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    Modulation of the Ni FUSI workfunction by Yb doping: from midgap to n-type band-edge

    Yu, HongYu
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    Chen, J.D.
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    Li, M.F.
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    Lee, S.J.
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    Kwong, D.L.
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    van Dal, Marc
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    Kittl, Jorge
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    Lauwers, Anne  
    Proceedings paper
    2005, Technical Digest International Electron Device Meeting (IEDM), 5/12/2005, p.27/03/2001-27/03/2004
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    Practical solutions to enhance EWF tunability of Ni FUSI gate electrode on HfO2

    Wang, X.P.
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    Yang, J.J.
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    Chen, J.D.
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    Xie, R.L.
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    Li, M.-F.
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    Zhu, C.X.
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    Yu, HongYu
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    Du, A.Y.
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    Lim, P.C.
    Proceedings paper
    2007, International Conference on Solid State Devices and Materials - SSDM, 18/09/2007, p.854-855
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    Widely tunable work function TaN/Ru stacking layer on HfLaO gate dielectric

    Wang, X.P.
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    Li, M.F.
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    Yu, HongYu
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    Yang, J.J.
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    Chen, J.D.
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    Zhu, C.X.
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    Du, A.Y.
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    Loh, W.Y.
    Journal article
    2008, IEEE Electron Device Letters, (29) 1, p.50-53

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