Browsing by Author "Chini, Alessandro"

AlGaNGaN-based HEMTs failure physics and reliability: mechanisms affecting gate edge and Schottky junction

Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaNGaN interface

Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: a complete model

Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias