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Browsing by Author "Cremel, Maxime"

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    Fabrication of porogen residue free ultra low-k PECVD material by subsequent H2-afterglow plasma treatment and UV curing

    Urbanowicz, Adam
    ;
    Vanstreels, Kris  
    ;
    Verdonck, Patrick  
    ;
    Shamiryan, Denis
    ;
    Cremel, Maxime
    Proceedings paper
    2010, Advanced Metallization Confererce 2009 - AMC 2009, 13/10/2009, p.65-71
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    Mechanism of k-value reduction of PECVD Low-k films treated with He/H2 ash plasma

    Urbanowicz, Adam
    ;
    Cremel, Maxime
    ;
    Vanstreels, Kris  
    ;
    Shamiryan, Denis
    ;
    De Gendt, Stefan  
    Meeting abstract
    2010, 3rd International Plasma Etch and Strip in Microelectronics Workshop - PESM, 4/03/2010
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    Porogen residue free ultra low-k PECVD material: fabrication, optical and mechanical properties

    Urbanowicz, Adam
    ;
    Vanstreels, Kris  
    ;
    Verdonck, Patrick  
    ;
    Cremel, Maxime
    ;
    De Gendt, Stefan  
    Meeting abstract
    2009, Advanced Metalization Conference, 13/10/2009

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