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Browsing by Author "Criel, Steven"

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    Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips

    Criel, Steven
    ;
    Bonjean, F.
    ;
    De Smedt, R.
    ;
    De Moerloose, Jan
    ;
    Martens, Luc  
    ;
    Olyslager, Frank
    Proceedings paper
    1998, International Symposium on Electromagnetic Compatibility. Symposium Record, 24/08/1998, p.734-738
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    Accurate finite difference time domain (FD-TD) analysis of arbitrary coaxial shields using the triaxial-cell characterization procedure

    Criel, Steven
    ;
    Martens, Luc  
    ;
    De Zutter, Daniel  
    Proceedings paper
    1995, Atlanta 1995.EMC - a Global Concern. IEEE 1995 International Symposium on Electromagnetic Compatibility. Symposium Record; Augus, p.179-182
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    Approximate simulation of the shielding effectiveness of a rectangular enclosure with a grid wall

    De Smedt, R.
    ;
    De Moerloose, Jan
    ;
    Criel, Steven
    ;
    De Zutter, Daniel  
    ;
    Olyslager, Frank
    ;
    Laermans, Eric  
    Proceedings paper
    1998, International Symposium on Electromagnetic Compatibility. Symposium Record, 24/08/1998, p.1030-1034
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    Assessment of the shielding effectiveness of a real enclosure

    De Smedt, R.
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    De Moerloose, Jan
    ;
    Criel, Steven
    ;
    De Zutter, Daniel  
    ;
    Olyslager, Frank
    ;
    Laermans, Eric  
    Proceedings paper
    1998, EMC'98. International Symposium on Electromagnetic Compatibility, 14/09/1998, p.248-253
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    Comparison of FDTD and MoM for shielding effectiveness modelling of test enclosures

    De Moerloose, Jan
    ;
    Criel, Steven
    ;
    De Smedt, R.
    ;
    Laermans, Eric  
    ;
    Olyslager, Frank
    ;
    De Zutter, Daniel  
    Proceedings paper
    1997, Proceedings of the IEEE 1997 International Symposium on Electromagnetic Compatiblity, 18/08/1997, p.596-601
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    EMC-Modelling and Characterisation of Coaxial Shieldings and of the Radiation of PCB's

    Criel, Steven
    PHD thesis
    1995-11
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    Evaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards

    Criel, Steven
    ;
    Martens, Luc  
    ;
    De Zutter, Daniel  
    Proceedings paper
    1994, Proceedings of the IEEE 3rd Topical Meeting of Electrical Performance of Electronic Packaging, 2/11/1994, p.51-53
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    Mixed assembly of PCB using a novel flip-chip technology

    Vanfleteren, Jan  
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    Stoukatch, Serguei
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    Vandecasteele, Bjorn  
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    Van Calster, Andre  
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    Criel, Steven
    Journal article
    2000, Advancing Microelectronics, (27) 5, p.28-30
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    Mixed assembly on PCB using a novel flip-chip technology

    Vanfleteren, Jan  
    ;
    Stoukatch, Serguei
    ;
    Vandecasteele, Bjorn  
    ;
    Van Calster, Andre  
    ;
    Criel, Steven
    Proceedings paper
    2000, IMAPS-EUROPE PRAGUE 2000. European Microelectronics Packaging and Interconnection Symposium Proceedings, 18/06/2000, p.65-70
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    Near- and Far-Field Characterization of Perforated Screens: Theoretical and Experimental Study of Proposed Definitions for the Shielding Performance

    Criel, Steven
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    Martens, Luc  
    ;
    De Zutter, Daniel  
    Proceedings paper
    1994, 1994 IEEE International Symposium on Electromagnetic Compatibility, 22/08/1994, p.298-302
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    Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

    Haelvoet, Kurt
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    Criel, Steven
    ;
    Dobbelaere, Franky
    ;
    Martens, Luc  
    ;
    De Langhe, Pascal
    ;
    De Smedt, R.
    Proceedings paper
    1996, Proceedings IEEE Instrumentation and Measurement Technology Conference, 4/06/1996, p.1119-1123
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    Numerical and experimental study of the shielding effectiveness of a metallic enclosure

    Olyslager, Frank
    ;
    Laermans, Eric  
    ;
    De Zutter, Daniel  
    ;
    Criel, Steven
    ;
    De Smedt, R.
    ;
    Lietaert, N.
    Journal article
    1999, IEEE Trans. Electromagnetic Compatibility, (41) 3, p.202-213
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    Simulations of small apertures and grids by the FDTD method

    De Moerloose, Jan
    ;
    De Smedt, R.
    ;
    Criel, Steven
    ;
    De Zutter, Daniel  
    Proceedings paper
    1998, EMC'98. International Symposium on Electromagnetic Compatibility, 14/09/1998, p.328-332
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    Theoretical and experimental determination of the shielding effectiveness of test enclosures

    Criel, Steven
    ;
    De Smedt, R.
    ;
    Laermans, Eric  
    ;
    Olyslager, Frank
    ;
    De Zutter, Daniel  
    ;
    Lietaert, N.
    Proceedings paper
    1997, Proceedings of the 12th International Zürich Symposium and Technical Exhibition on Electromagnetic Compatibility, 18/02/1997, p.223-228
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    Theoretical and experimental near-field characterization of perforated shields

    Criel, Steven
    ;
    Martens, Luc  
    ;
    De Zutter, Daniel  
    Journal article
    1994, IEEE Trans. Electromagnetic Compatibility, (36) 3, p.161-168
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    Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures

    Criel, Steven
    ;
    Haelvoet, Kurt
    ;
    Martens, Luc  
    ;
    De Zutter, Daniel  
    ;
    Franchois, Ann
    ;
    De Smedt, R.
    Proceedings paper
    1995, Atlanta 1995.EMC - a Global Concern. IEEE 1995 International Symposium on Electromagnetic Compatibility. Symposium Record; Augus, p.471-474

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