Browsing by Author "D'Haeger, V."
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Publication Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
Proceedings paper1998, Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF, 5/10/1998, p.1009-1014Publication Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
Journal article1998, Microelectronics Reliability, (38) 6_8, p.1009-1014Publication The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines
Journal article1998, Microelectronics Reliability, (38) 1, p.87-98Publication The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique
Journal article1999, Microelectronics and Reliability, (39) 11, p.1657-1665