Browsing by Author "Da Rold, Martina"
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Publication A 0.35μm SiGe BiCMOS process featuring a 80 GHz Fmax HBT and integrated high-Q RF passive components
Proceedings paper2000, Proceedings Bipolar/BiCMOS Circuits and Technology Meeting - BCTM, 24/09/2000, p.106-109Publication CMOS device optimisation for mixed-signal technologies
;Stolk, Peter ;Tuinhout, Hans ;Duffy, Ray ;Augendre, Emmanuel ;Bellefroid, L. P.Bolt, M. J. B.Proceedings paper2001, IEDM Technical Digest, 2/12/2001, p.215-218Publication Flicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide
Proceedings paper2001, Proceedings of the 16th International Conference on Noise in Physical Systems and 1/f Fluctuations - ICNF, 22/10/2001, p.177-180Publication Gate dielectrics for high performance and low power CMOS SoC applications
;Cubaynes, Florence ;Dachs, Charles ;Detcheverry, Celine ;Zegers, A.Venezia, VincentProceedings paper2002, ESSDERC - 32nd European Solid-State Device Research Conference, 24/09/2002, p.427-430Publication Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS
Journal article2001, Microelectronics Reliability, (41/42) 12, p.1933-1938Publication Impact of nitridation of SiO2 gate oxide on 1/f noise in 0.18μm CMOS
Proceedings paper2000, Proceedings of the 30th European Solid-State Device Research Conference - ESSDERC, 11/09/2000, p.512-515Publication NO oxides for low noise 0.18μm analog CMOS
Proceedings paper2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.111-114Publication On the basic correlation between polysilicon resistor linearity, matching and 1/f noise
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.648-651Publication Study of breakdown effects in silicon multiguard structures
;Da Rold, Martina ;Bacchetta, N. ;Bisello, D. ;Paccagnella, A. ;Dalla Betta, G. F.Verzellesi, G.Journal article1999, IEEE Trans. Nuclear Science, (46) 4, Pt.3, p.1215-1223