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Browsing by Author "Da Rold, Martina"

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    A 0.35μm SiGe BiCMOS process featuring a 80 GHz Fmax HBT and integrated high-Q RF passive components

    Decoutere, Stefaan  
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    Vleugels, Frank  
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    Kuhn, Rudiger
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    Loo, Roger  
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    Caymax, Matty  
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    Jenei, Snezana
    Proceedings paper
    2000, Proceedings Bipolar/BiCMOS Circuits and Technology Meeting - BCTM, 24/09/2000, p.106-109
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    CMOS device optimisation for mixed-signal technologies

    Stolk, Peter
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    Tuinhout, Hans
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    Duffy, Ray
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    Augendre, Emmanuel
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    Bellefroid, L. P.
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    Bolt, M. J. B.
    Proceedings paper
    2001, IEDM Technical Digest, 2/12/2001, p.215-218
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    Flicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide

    Simoen, Eddy  
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    Da Rold, Martina
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    Claeys, Cor
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    Lukyanchikova, N.
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    Petrichuk, M.
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    Garbar, N.
    Proceedings paper
    2001, Proceedings of the 16th International Conference on Noise in Physical Systems and 1/f Fluctuations - ICNF, 22/10/2001, p.177-180
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    Gate dielectrics for high performance and low power CMOS SoC applications

    Cubaynes, Florence
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    Dachs, Charles
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    Detcheverry, Celine
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    Zegers, A.
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    Venezia, Vincent
    Proceedings paper
    2002, ESSDERC - 32nd European Solid-State Device Research Conference, 24/09/2002, p.427-430
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    Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS

    Da Rold, Martina
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    Simoen, Eddy  
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    Mertens, S.
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    Schaekers, Marc  
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    Badenes, Gonçal
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    Decoutere, Stefaan  
    Journal article
    2001, Microelectronics Reliability, (41/42) 12, p.1933-1938
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    Impact of nitridation of SiO2 gate oxide on 1/f noise in 0.18μm CMOS

    Da Rold, Martina
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    Simoen, Eddy  
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    Badenes, Gonçal
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    Decoutere, Stefaan  
    Proceedings paper
    2000, Proceedings of the 30th European Solid-State Device Research Conference - ESSDERC, 11/09/2000, p.512-515
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    NO oxides for low noise 0.18μm analog CMOS

    Da Rold, Martina
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    Simoen, Eddy  
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    De Jaeger, Brice  
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    Lietaer, Nicolas
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    Rothschild, Aude
    Proceedings paper
    2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.111-114
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    On the basic correlation between polysilicon resistor linearity, matching and 1/f noise

    Da Rold, Martina
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    Van Huylenbroeck, Stefaan  
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    Knuts, Bruno  
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    Simoen, Eddy  
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    Decoutere, Stefaan  
    Proceedings paper
    1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.648-651
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    Study of breakdown effects in silicon multiguard structures

    Da Rold, Martina
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    Bacchetta, N.
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    Bisello, D.
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    Paccagnella, A.
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    Dalla Betta, G. F.
    ;
    Verzellesi, G.
    Journal article
    1999, IEEE Trans. Nuclear Science, (46) 4, Pt.3, p.1215-1223

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