Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Daily, Robert"

Filter results by typing the first few letters
Now showing 1 - 20 of 22
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    3D IC process development for enabling chip-on-chip and chip on wafer multi-stacking at assembly

    Daily, Robert
    ;
    Capuz, Giovanni  
    ;
    Wang, Teng
    ;
    Bex, Pieter  
    ;
    Struyf, Herbert  
    ;
    Sleeckx, Erik  
    Meeting abstract
    2015, International Conference on Electronic Packaging & iMAPS All Asia Conference - ICEP-IACC, 14/04/2015, p.56-60
  • Loading...
    Thumbnail Image
    Publication

    3D stacking induced mechanical stress effects

    Cherman, Vladimir  
    ;
    Van der Plas, Geert  
    ;
    De Vos, Joeri  
    ;
    Ivankovic, Andrej
    ;
    Lofrano, Melina  
    Proceedings paper
    2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.309-315
  • Loading...
    Thumbnail Image
    Publication

    Cobalt UBM for fine pitch microbump applications in 3DIC

    Derakhshandeh, Jaber  
    ;
    De Preter, Inge  
    ;
    Vandersmissen, Kevin  
    ;
    Dictus, Dries  
    ;
    Di Piazza, Luca  
    Proceedings paper
    2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.221-224
  • Loading...
    Thumbnail Image
    Publication

    Comparative study of 3D stacked IC and 3D interposer integration: processing and assembly challenges

    De Vos, Joeri  
    ;
    Cherman, Vladimir  
    ;
    Detalle, Mikael  
    ;
    Wang, Teng
    ;
    Salahouelhadj, Abdellah  
    Proceedings paper
    2014, IEEE 3D Sytem Integration Conference - 3DIC, 1/12/2014, p.1-7
  • Loading...
    Thumbnail Image
    Publication

    Cu-Cu insertion bonding technique using photosensitive polymer as WLUF

    Potoms, Goedele  
    ;
    Wang, Teng
    ;
    Derakhshandeh, Jaber  
    ;
    Daily, Robert
    ;
    Capuz, Giovanni  
    Proceedings paper
    2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.313-317
  • Loading...
    Thumbnail Image
    Publication

    Developing underfill process in screening of no-flow underfill and wafer-applied underfill materials for 3D stacking

    Rebibis, Kenneth June  
    ;
    Capuz, Giovanni  
    ;
    Daily, Robert
    ;
    Gerets, Carine  
    ;
    Duval, Fabrice  
    ;
    Wang, Teng
    Proceedings paper
    2013, 15th Electronics Packaging Technology Conference - EPTC, 11/12/2013, p.124-129
  • Loading...
    Thumbnail Image
    Publication

    Development and evaluation of photodefinable wafer level underfill

    Mitsukura, Kazuyuki
    ;
    Saisyo, Ryouta
    ;
    Makino, Tatsuya
    ;
    Hatakeyama, Keiichi
    Journal article
    2015, Journal of Photopolymer Science and Technology, (28) 2, p.229-232
  • Loading...
    Thumbnail Image
    Publication

    Development of underfilling and thermo-compression bonding processes for stacking multi-layer 3D ICs

    Wang, Teng
    ;
    Daily, Robert
    ;
    Capuz, Giovanni  
    ;
    Gerets, Carine  
    ;
    Rebibis, Kenneth June  
    ;
    Miller, Andy  
    Proceedings paper
    2014, 5th Electronics System-Integration Technology Conference - ESTC, 16/09/2014, p.1-5
  • Loading...
    Thumbnail Image
    Publication

    Effects of packaging on mechanical stress in 3D-ICs

    Cherman, Vladimir  
    ;
    Lofrano, Melina  
    ;
    Simons, Veerle  
    ;
    Gonzalez, Mario  
    ;
    Van der Plas, Geert  
    Proceedings paper
    2015, IEEE 65th Electronic Components & Technology Conference - ECTC, 26/05/2015, p.354-361
  • Loading...
    Thumbnail Image
    Publication

    Experimental thermal characterization and thermal model validation of 3D packages using a programmable thermal test chip

    Oprins, Herman  
    ;
    Cherman, Vladimir  
    ;
    Van der Plas, Geert  
    ;
    Maggioni, Federica
    ;
    De Vos, Joeri  
    Proceedings paper
    2015-05, IEEE Electronic Components & Technology Conference - ECTC, 26/05/2015, p.1134-1141
  • Loading...
    Thumbnail Image
    Publication

    Exploring process interaction of no-flow underfill and thermo-compression bonding in D2D stacking

    Capuz, Giovanni  
    ;
    Daily, Robert
    ;
    Wang, Teng
    ;
    Struyf, Herbert  
    ;
    Miller, Andy  
    ;
    Rebibis, Kenneth June  
    Meeting abstract
    2013, International Wafer-Level Packaging Conference - IWLPC, 5/11/2013
  • Loading...
    Thumbnail Image
    Publication

    Fabrication of silicon based microfluidics device for cell sorting applications

    Majeed, Bivragh  
    ;
    Liu, Chengxun  
    ;
    Van Acker, Lut  
    ;
    Daily, Robert
    ;
    Miyazaki, Tomokazu
    Proceedings paper
    2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.165-169
  • Loading...
    Thumbnail Image
    Publication

    Integration of capillary self-alignment for Face to Face micro bump bonding

    Pham, Nga  
    ;
    Daily, Robert
    ;
    Armini, Silvia  
    ;
    Delande, Tinne  
    ;
    Pantouvaki, Marianna  
    Proceedings paper
    2013-09, European Microelectronics Packaging Conference - EMPC, 9/09/2013
  • Loading...
    Thumbnail Image
    Publication

    Interposer technology for high band width interconnect applications

    Detalle, Mikael  
    ;
    La Manna, Antonio  
    ;
    De Vos, Joeri  
    ;
    Nolmans, Philip  
    ;
    Daily, Robert
    ;
    Beyer, Gerald  
    Proceedings paper
    2013, 63rd Electronic Components And Technology Conference - ECTC, 28/05/2013, p.323-328
  • Loading...
    Thumbnail Image
    Publication

    NiB Capping of Cu landing pads for thermocompression bonding

    England, Luke
    ;
    Dictus, Dries  
    ;
    De Vos, Joeri  
    ;
    Conard, Thierry  
    ;
    Daily, Robert
    ;
    Marinissen, Erik Jan  
    Meeting abstract
    2014, 23rd Materials for Advanced Metallization Conference, 2/03/2014
  • Loading...
    Thumbnail Image
    Publication

    Process development to enable 3D IC multi-tier die bond for 20 $lm pitch and beyond

    Hu, Yu-Hsiang
    ;
    Liu, C.S.
    ;
    Chen, M.T.
    ;
    Cheng, M.D.
    ;
    Kuo, H.J.
    ;
    Lii, M.J.
    ;
    La Manna, Antonio  
    Proceedings paper
    2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.572-575
  • Loading...
    Thumbnail Image
    Publication

    Process development to enable die sorting and 3D IC stacking

    La Manna, Antonio  
    ;
    Daily, Robert
    ;
    Capuz, Giovanni  
    ;
    Rebibis, Kenneth June  
    ;
    Bogaerts, Lieve  
    Proceedings paper
    2012-12, 14th Electronics Packaging Technology Conference - EPTC, 5/12/2012
  • Loading...
    Thumbnail Image
    Publication

    Reliability of 3D package using wafer level underfill and low CTE epoxy mold compound materials

    Cadacio Jr., Francisco
    ;
    Rebibis, Kenneth June  
    ;
    Capuz, Giovanni  
    ;
    Daily, Robert
    ;
    Gerets, Carine  
    Proceedings paper
    2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.444-448
  • Loading...
    Thumbnail Image
    Publication

    Stacking aspects in the view of scaling

    De Vos, Joeri  
    ;
    La Manna, Antonio  
    ;
    Daily, Robert
    ;
    Rebibis, Kenneth June  
    ;
    Beyne, Eric  
    Proceedings paper
    2012, IMAPS 45th International Symposium on Microelectronics, 9/09/2012, p.735-740
  • Loading...
    Thumbnail Image
    Publication

    Underfill material screening and process characterization for 3D stacking

    Rebibis, Kenneth June  
    ;
    La Manna, Antonio  
    ;
    Gerets, Carine  
    ;
    Beyne, Eric  
    ;
    Daily, Robert
    Proceedings paper
    2012, 4th Electronics System Integration Technologies Conference - ESTC, 17/09/2012
  • «
  • 1 (current)
  • 2
  • »

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings