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Browsing by Author "Das, Jo"

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    2kV breakdown voltage GaN-on-Si DHFETs with sub-micron thick AlGaN Buffer

    Srivastava, Puneet
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    Cheng, Kai
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    Das, Jo
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    Van Hove, Marleen
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    Leys, Maarten
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    Marcon, Denis  
    Proceedings paper
    2012, International Conference on Compound Semiconductor MANufacturing TECHnology - MANTECH, 23/04/2012
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    A 96% efficient high-frequency DC–DC converter using E-mode GaN DHFETs on Si

    Das, Jo
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    Everts, Jordi
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    Van den Keybus, Jeroen
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    Van Hove, Marleen
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    Visalli, Domenica
    Journal article
    2011, IEEE Electron Device Letters, (32) 10, p.1370-1372
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    A comprehensive reliability investigation of the voltage-, temperature- and device geometry-dependence of the gate degradation on state-of-the-art GaN-on-Si HEMTs

    Marcon, Denis  
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    Kauerauf, Thomas
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    Medjdoub, Farid
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    Das, Jo
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    Van Hove, Marleen
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    Srivastava, Puneet
    Proceedings paper
    2010-12, IEEE International Electron Device Meeting - IEDM, 6/12/2010, p.472-472
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    A hard switching VIENNA boost converter for characterization of AlGaN/GaN/AlGaN power DHFETs

    Everts, Jordi
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    Jacqmaert, Pieter
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    Gelagaev, Ratmir
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    Das, Jo
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    Germain, Marianne
    Proceedings paper
    2010, International Exhibition and Conference for Power Electronics, Intelligent Motion, Power Quality - PCIM, 4/05/2010, p.309-314
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    A high-efficiency, high-frequency boost converter using enhancement mode GaN DHFETs on silicon

    Everts, Jordi
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    Das, Jo
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    Van Den Keybus, Jeroen
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    Genoe, Jan  
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    Germain, Marianne
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    Driesen, Johan  
    Proceedings paper
    2010, IEEE Energy Conversion Congress and Exposition - ECCE, 12/09/2010, p.3296-3302
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    A load-pull wafer-mapper

    Vanaverbeke, Fre
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    Vaesen, Kristof  
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    Xiao, Dongping
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    Pauwels, Luc  
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    De Raedt, Walter  
    Proceedings paper
    2008, IEEE MTT-S International Microwave Symposium Digest, 15/06/2008, p.113-119
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    A very compact power amplifier using GaN HEMTs in multi-layer thin-film technology

    Liu, Rui
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    Schreurs, Dominique  
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    De Raedt, Walter  
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    Vanaverbeke, Fre
    ;
    Das, Jo
    ;
    Germain, Marianne
    Proceedings paper
    2010, Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits - INMMiC, 26/04/2010, p.37-40
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    AlGaN-on-Si backside illuminated photodetectors for the extreme ultraviolet (EUV) range

    Malinowski, Pawel  
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    Duboz, Jean-Yves
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    John, Joachim  
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    Sturdevant, Charles
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    Das, Jo
    ;
    Derluyn, Joff
    Proceedings paper
    2010, Optical Sensing and Detection, 12/04/2010, p.772617
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    AlGaN/GaN HEMTs on Si substrates: Can they overcome the thermal limit?

    Das, Jo
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    Oprins, Herman  
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    Derluyn, Joff
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    Germain, Marianne
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    Borghs, Gustaaf  
    Proceedings paper
    2007-05, 31st Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 20/05/2007, p.277-280
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    AlGaN/GaN HEMTs with backside Schottky contact

    Russo, S.
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    Di Carlo, A.
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    Das, Jo
    ;
    Germain, Marianne
    ;
    Borghs, Gustaaf  
    Proceedings paper
    2007, 31st Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 20/05/2007, p.215
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    AlGaN/GaN/AlGaN double heterostructure FETs for power electronics applications

    Srivastava, Puneet
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    Das, Jo
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    Visalli, Domenica
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    Van Hove, Marleen
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    Derluyn, Joff
    Meeting abstract
    2010, Young Researchers Symposium 2010 organized by IEEE Joint IAS- PELS-PES Chapter Benelux, 29/03/2010
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    Alternative approaches to nonvolatile magnetic memory: aspects of integrated magnetic structures

    De Boeck, Jo  
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    Bruynseraede, Christophe
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    Boeve, Hans
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    Dessein, Kristof
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    Dutta, Barundeb  
    Meeting abstract
    1998, Abstracts 3rd International Symposium on Metallic Multilayers - MML, 14/06/1998, p.109
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    Backside-illuminated GaN-on-Si Schottky photodiodes for UV radiation detection

    Malinowski, Pawel  
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    John, Joachim  
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    Duboz, Jean-Yves
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    Hellings, Geert  
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    Lorenz, Anne
    Journal article
    2009-12, IEEE Electron Device Letters, (30) 12, p.1308-1310
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    Bit-selective read and write with coincident current scheme in spin-valve/diode MRAM cells

    Boeve, Hans
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    Das, Jo
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    Bruynseraede, Christophe
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    De Boeck, Jo  
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    Borghs, Gustaaf  
    Journal article
    1998, Electronics Letters, (34) 18, p.1754-1755
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    Conductance creep and breakdown of stressed ferromagnetic tunneljunctions

    Das, Jo
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    De Boeck, Jo  
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    Lagae, Liesbet  
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    Borghs, Gustaaf  
    Meeting abstract
    2001, Abstracts 8th Joint MMM-Intermag Conference, 7/01/2001, p.386
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    Contactless electroreflectance evidence for reduction in the surface potential barrier in AlGaN/GaN heterostructures passivated by SiN layer

    Kudrawiec, Robert
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    Paszkiewicz, B.
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    Motyka, M.
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    Misciewic, Jan
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    Derluyn, Joff
    ;
    Lorenz, Anne
    Journal article
    2008-11, Journal of Applied Physics, (104) 9, p.96108
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    Development and Integration of a high efficiency baseline leading to 23% IBC cells

    Aleman, Monica  
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    Das, Jo
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    Janssens, Tom
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    Pawlak, Bartek  
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    Posthuma, Niels  
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    Robbelein, Jo
    Proceedings paper
    2012, Proceedings of the 2nd International Conference on Crystalline Silicon Photovoltaics - SiliconPV, 3/04/2012, p.638-945
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    Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology

    Liu, Rui
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    Schreurs, Dominique  
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    De Raedt, Walter  
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    Vanaverbeke, Fre
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    Das, Jo
    ;
    Mertens, Robert  
    Journal article
    2011, Microelectronics Reliability, (51) 9_11, p.1721-1724
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    Excellent stability of GaN-on-Si HEMTs with 5 μm gate-drain spacing tested in off-state at a record drain voltage of 200V and 200°C

    Marcon, Denis  
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    Van Hove, Marleen
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    Visalli, Domenica
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    Derluyn, Joff
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    Das, Jo
    ;
    Medjdoub, Farid
    Proceedings paper
    2009, International Conference on Solid-State Devices and Materials Conference - SSDM, 7/10/2009, p.816-817
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    Excellent stability of GaN-on-Si high electron mobility transistors with 5 μm gate/drain spacing tested in off-state at a record drain voltage of 200 V and 200 °C

    Marcon, Denis  
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    Van Hove, Marleen
    ;
    Visalli, Domenica
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    Derluyn, Joff
    ;
    Das, Jo
    ;
    Medjdoub, Farid
    Journal article
    2010, Japanese Journal of Applied Physics, (49) 4, p.04DF07
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