imec Institutional Repository Browsing {{ collection }} by Author "De Gryse, O."

Publication

A novel approach to analyse FTIR spectra of precipitates in moderately and heavily doped silicon

De Gryse, O.

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Vanhellemont, J.

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Clauws, P.

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Lebedev, O.

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Van Landuyt, J.

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Simoen, Eddy

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Claeys, Cor

Journal article

2003, Physica B, 340-342, p.1013-1017

Publication

Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon

Simoen, Eddy

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Claeys, Cor

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Loo, Roger

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De Gryse, O.

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Clauws, P.

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Job, R.

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Ulyashin, A.G.

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Fahrner, W.

Journal article

2003, Materials Science and Engineering B, (102) 1_3, p.207-212

Publication

Characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy

De Gryse, O.

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Clauws, P.

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Vanhellemont, Jan

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Lebedev, O.I.

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Van Landuyt, J.

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Simoen, Eddy

Journal article

2004, Journal of the Electrochemical Society, (151) 9, p.G598-G605

Publication

Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy

De Gryse, O.

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Clauws, P.

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Vanhellemont, J.

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Lebedev, O.

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Van Landuyt, J.

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Simoen, Eddy

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Claeys, Cor

Proceedings paper

2002, High Purity Silicon VII, 20/10/2002, p.183-194

Publication

Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM

De Gryse, O.

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Clauws, P.

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Lebedev, O.

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Van Landuyt, J.

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Vanhellemont, Jan

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Claeys, C.

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Simoen, Eddy

Journal article

2001, Physica B, 308, p.294-297

Publication

Deep levels in oxygenated n-type high-resistivity FZ silicon before and after a low-temperature hydrogenation step

Simoen, Eddy

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Claeys, Cor

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Job, R.

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Ulyashin, A.G.

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Fahrner, W.R.

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Tonelli, G.

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De Gryse, O.

Journal article

2003, Journal of the Electrochemical Society, (150) 9, p.G520-G526

Publication

Determination of the oxygen content in platelike and octahedral oxygen precipitates in silicon with FT-IR spectroscopy

De Gryse, O.

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Clauws, P.

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Vanhellemont, Jan

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Claeys, Cor

Proceedings paper

1997, Defects in Semiconductors 19 - ICDS 19, 21/07/1997, p.405-410

Publication

DLTS studies of high-temperature electron irradiated Cz n-Si

Neimash, V.

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Kras'ko, M.

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Kraitchinskii, A.

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Voytivych, V.

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Tishenko, V.

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Simoen, Eddy

Journal article

2004, Physica Status Solidi A, (201) 3, p.509-516

Publication

Grown-in lattice defects and diffusion in czochralski-grown germanium

Vanhellemont, J.

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De Gryse, O.

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Hens, S.

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Vanmeerbeek, P.

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Poelman, D.

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Clauws, P.

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Simoen, Eddy

Journal article

2004, Defect and Diffusion Forum, 230-232, p.149-176

Publication

Hydrogen plasma-enhanced thermal donor formation in n-type oxygen-doped high-resistivity float-zone silicon

Simoen, Eddy

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Claeys, Cor

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Job, R.

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Ulyashin, A.G.

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Fahrner, W.R.

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De Gryse, O.

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Clauws, P.

Journal article

2002, Applied Physics Letters, (81) 10, p.1842-1844

Publication

Optical spectroscopy of oxygen precipitates in heavily doped p-type silicon

Simoen, Eddy

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Loo, Roger

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Claeys, Cor

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De Gryse, O.

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Clauws, P.

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Van Landuyt, J.

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Lebedev, O.

Journal article

2002, Journal of Physics - Condensed Matter, (14) 48, p.13185-13193

Publication

Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques

De Gryse, O.

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Clauws, P.

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Van Landuyt, J.

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Lebedev, O.

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Claeys, Cor

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Simoen, Eddy

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Vanhellemont, Jan

Journal article

2002, Journal of Applied Physics, (91) 4, p.2493-2498

Browsing by Author "De Gryse, O."