Browsing by Author "Dos Santos, Sara"
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Publication Advantages of different source/drain engineering on scaled UTBOX FD SOI nMOSFETs at high temperature operation
Journal article2014, Solid-State Electronics, (91) 1, p.53-58Publication Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
;Sasaki, Katia ;Nicoletti, Talitha ;Almeida, Luciano ;Dos Santos, SaraNissimoff, AlbertJournal article2014, Solid-State Electronics, 97, p.30-37Publication Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
;Dos Santos, Sara ;Cretu, Bogdan ;Strobel, Vincent ;Routoure, Jean-MarcCarin, RegisJournal article2014, Solid-State Electronics, 97, p.14-22Publication Low-frequency noise in high-k and SiO2 UTBOX SOI nMOSFETs
;Dos Santos, Sara ;Martino, Joao A. ;Strobel, Vincent ;Cretu, BogdanRoutoure, Jean-MarcProceedings paper2013, China Semiconductor Technology International Conference - CSTIC, 19/03/2013, p.87-92Publication On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs
Journal article2013, IEEE Transactions on Electron Devices, (60) 1, p.444-450Publication The activation energy dependence on the electric field in UTBOX SOI FBRAM devices
Proceedings paper2013, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, 7/10/2013, p.7.8Publication Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
Meeting abstract2014, E-MRS Spring Meeting Symposium H: Analytical Techniques for Precise Characterization of Nanomaterials - ALTECH, 26/05/2014