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Browsing by Author "Driessen, Frank"

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    A 65-nm node SRAM solution using alt-PSM with ArF lithography

    Driessen, Frank
    ;
    Zawadzki, Mary T.
    ;
    Krishnan, Prakash R.
    ;
    Balasinski, Artur
    Proceedings paper
    2004-05, Design and Process Integration for Microelectronic Manufacturing II, 22/02/2004, p.224-234
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    Aerial image simulations of soft and phase defects in 193-nm lithography for 10-nm node

    Driessen, Frank
    ;
    Philipsen, Vicky  
    ;
    Jonckheere, Rik  
    ;
    Liu, Hua-Yu
    ;
    Karklin, Linard
    Proceedings paper
    2002, Optical Microlithography XV, 5/03/2002, p.1180-1189
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    Complementary phase-shift mask towards 70-nm technology node

    Driessen, Frank
    ;
    Vandenberghe, Geert  
    ;
    Ercken, Monique  
    ;
    Montgomery, Patrick
    ;
    Ronse, Kurt  
    Proceedings paper
    2002, Optical Microlithography XV, 5/03/2002, p.Addendum
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    Extending ArF to the 65-nm node with full-phase lithography

    Driessen, Frank
    ;
    Pierrat, C.
    ;
    Vandenberghe, Geert  
    ;
    Ronse, Kurt  
    ;
    Van Adrichem, Paul  
    ;
    Liu, H.Y.
    Proceedings paper
    2003, Optical Microlithography XVI, 23/02/2003, p.1091-1102
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    Full phase-shifting methodology for 65-nm node lithography

    Pierrat, C.
    ;
    Driessen, Frank
    ;
    Vandenberghe, Geert  
    Proceedings paper
    2003, Optical Microlithography XVI, 23/02/2003, p.282-293
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    Performance optimisation of the double exposure alternatin PSM for sub-100 nm ICs

    Vandenberghe, Geert  
    ;
    Driessen, Frank
    ;
    Van Adrichem, Paul  
    ;
    Ronse, Kurt  
    Oral presentation
    2001, 21st Annual BACUS Symposium on Photomask Technology; October 2001; Monterey, CA, USA.
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    Performance optimization of the double-exposure alternating PSM for (sub-)100-nm ICs

    Vandenberghe, Geert  
    ;
    Driessen, Frank
    ;
    Van Adrichem, Paul  
    ;
    Ronse, Kurt  
    ;
    Li, Jason
    ;
    Karklin, Linard
    Proceedings paper
    2002, 21st Annual BACUS Symposium on Photomask Technology, 3/10/2001, p.394-405

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