Browsing by Author "Elattari, Brahim"
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Publication A fast and flexible thermal simulation tool validated on smart power devices
Proceedings paper2005-05, Proceedings International Symposium on Power Semiconductor Devices - ISPSD, 23/05/2005, p.111-114Publication Breakdown and hot carrier injection in deep trench isolation structures
Journal article2005, Solid-State Electronics, (49) 8, p.1370-1375Publication Characterization of dynamic SOA of power MOSFETs limited by electrothermal breakdown
Proceedings paper2005-09, Proceedings of the 35th European Solid-State Device Research Conference - ESSDERC, 12/09/2005, p.465-468Publication Comprehensive study of postprocessed copper heat sinks on smart power drivers for thermal SOA improvement
Proceedings paper2005-04, Proceedings International Reliability Physics Symposium, 17/04/2005, p.652-653Publication Design and characterization of a post-processed copper heat sink for smart power drivers
Proceedings paper2005-04, IEEE International Conference on Microelectronic Test Structures, 4/04/2005, p.27-31Publication HfO2/spacer-interface breakdown in HfO2 high-k/poly-silicon gate stacks
;Ranjan, R ;Pey, K.L. ;Tung, C.H. ;Tang, L.J. ;Elattari, BrahimKauerauf, ThomasJournal article2005-06, Microelectronic Engineering, p.370-373Publication Impact of charging on breakdown in deep trench isolation structures
Proceedings paper2003, Proceedings 33rd European Solid-State Devices Research Conference - ESSDERC, 16/09/2003, p.513-516Publication Modeling of energy capability of power devices with copper layer integration
Proceedings paper2005-09, Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 1/09/2005, p.207-210