Browsing by Author "Etherton, M."

Now showing 1 - 4 of 4

Characterization and modeling of transient device behavior under CDM ESD stress

Willemen, J.
;
Andreini, A.
;
De Heyn, Vincent
;
Esmark, K.
;
Etherton, M.
;
Gieser, H.
Proceedings paper
2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.88-97
Characterization and modeling of transient device behavior under CMD ESD stress

Willemen, J.
;
Andreini, A.
;
De Heyn, Vincent
;
Esmark, K.
;
Etherton, M.
;
Gieser, H.
Journal article
2004, Journal of Electrostatics, (62) 2_3, p.133-153
Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Stadler, W.
;
Esmark, K.
;
Reynders, K.
;
Zubeidat, M.
;
Graf, M.
;
Wilkening, W.
;
Willemen, J.
;
Qu, D.
Journal article
2005, Microelectronics Reliability, (45) 2, p.269-277
Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Stadler, Wolfgang
;
Esmark, K.
;
Reynders, K.
;
Zuhbeidat, M.
;
Graf, M.
;
Wilkening, W.
;
Willemen, J.
Proceedings paper
2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.319-327