Browsing by Author "Faraone, Lorenzo"
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Publication A 5 V-Compatible Flash EEPROM Cell with Microsecond Programming Time for Embedded Memory Applications
Journal article1994, IEEE Trans. Components, Packaging, and Manufacturing Techn. Part A, (17) 3, p.380-389Publication Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices
Proceedings paper1994, Proceedings of the 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF, 4/10/1994, p.147-153Publication Write/erase degradation and disturb effects in source-side injection flash EEPROM devices
Journal article1995, Quality and Reliability Engineering International, (11) 4, p.239-246Publication Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms
Journal article1995, IEEE Trans. Electron Devices, (42) 11, p.1992-1998