Browsing by Author "Fatermans, J."

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Atom column detection from simultaneously acquired ABF and ADF STEM images

Fatermans, J.
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den Dekker, A. J.
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Mueller-Caspary, K.
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Gauquelin, N.
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Verbeeck, J.
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Van Aert, S.
Journal article
2020, ULTRAMICROSCOPY, 219, p.113046
Atom column detection from STEM images using the maximum a posteriori probability rule

Fatermans, J.
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den Dekker, A.J.
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O'Leary, C.M.
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Nellist, P.D.
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Van Aert, S.
Meeting abstract
2019, Microscopy Conference 2019, 1/09/2019
Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection

Fatermans, J.
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den Dekker, Arnold Jan
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Müller-Caspary, K.
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Lobato, I.
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Van Aert, S.
Meeting abstract
2018, 69th Annual Meeting of the Nordic Microscopy Society - SCANDEM, 25/06/2018, p.G-O4
Coupling Charge and Topological Reconstructions at Polar Oxide Interfaces

van Thiel, T. C.
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Brzezicki, W.
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Autieri, C.
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Hortensius, J. R.
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Afanasiev, D.
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Gauquelin, N.
Journal article
2021, PHYSICAL REVIEW LETTERS, (127) 12
Single atom detection from low contrast-to-noise ratio electron microscopy images

Fatermans, J.
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den Dekker, Arnold Jan
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Müller-Caspary, K.
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Lobato, Ivan
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O'Leary, C. M.
Journal article
2018-07, Physical Review Letters, (121) 5, p.56101
The maximum a posteriori probability rule for atom column detection from HAADF STEM images

Fatermans, J.
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Van Aert, Sandra
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den Dekker, Arnold-Jan
Journal article
2019-06, Ultramicroscopy, 201, p.81-91
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images

Fatermans, J.
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den dekker, Arnold Jan
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Müller-Caspary, K.
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Lobato, I.
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Van Aert, Sandra
Meeting abstract
2018, 19th International Microscopy Congress - IMC19, 9/09/2018