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Browsing by Author "Fischetti, Massimo"

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    Calculation of the electron mobility in III-V inversion layers with high-kappa dielectrics

    O'Regan, Terrance
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    Soree, Bart  
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    Fischetti, Massimo
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    Jin, S.
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    Magnus, Wim  
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    Meuris, Marc  
    Journal article
    2010, Journal of Applied Physics, (108) 10, p.103705
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    Electron mobility calculations for Si, Ge and III-V inversion layers with HfO2

    O'Regan, Terrance
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    Fischetti, Massimo
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    Soree, Bart  
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    Magnus, Wim  
    Oral presentation
    2007, 12th International Workshop on Computational Electronics - IWCE12
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    Electron mobility calculations for Si, Ge and III-V inversion layers with HfO2

    O'Regan, Terrance
    ;
    Fischetti, Massimo
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    Soree, Bart  
    ;
    Magnus, Wim  
    Proceedings paper
    2007, 12th International Workshop on Computational Electronics - IWCE12, 8/10/2007
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    Field induced quantum confinement in indirect semiconductors: quantum mechanical and modified semiclassical model

    Vandenberghe, William
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    Soree, Bart  
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    Magnus, Wim  
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    Groeseneken, Guido  
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    Verhulst, Anne  
    Proceedings paper
    2011, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 8/09/2011
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    Figure of merit for and identification of sub-60 mV/decade devices

    Vandenberghe, William
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    Verhulst, Anne  
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    Soree, Bart  
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    Magnus, Wim  
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    Groeseneken, Guido  
    Journal article
    2013, Applied Physics Letters, (102) 1, p.13510
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    Generalized phonon-assisted Zener tunneling in indirect semiconductors with non-uniform electric fields: A rigorous approach

    Vandenberghe, William
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    Soree, Bart  
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    Magnus, Wim  
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    Fischetti, Massimo
    Journal article
    2011, Journal of Applied Physics, (109) 12, p.124503
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    Hole mobility in Ge and GaAs p-channel inversion layers with low-k insulator

    Zhang, Yan
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    Fischetti, Massimo
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    Soree, Bart  
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    Magnus, Wim  
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    Heyns, Marc  
    Proceedings paper
    2008, 38th European Solid-State Device Research Conference - ESSDERC, 15/09/2008
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    Impact of field-induced quantum confinement in tunneling field-effect

    Vandenberghe, William
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    Soree, Bart  
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    Magnus, Wim  
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    Groeseneken, Guido  
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    Fischetti, Massimo
    Journal article
    2011, Applied Physics Letters, (98) 14, p.143503
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    Inter-ribbon tunneling in graphene: an atomistic Bardeen approach

    Van de Put, Maarten
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    Vandenberghe, William
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    Soree, Bart  
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    Magnus, Wim  
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    Fischetti, Massimo
    Journal article
    2016, Journal of Applied Physics, (119) 21, p.214306
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    Modeling of phonon-assisted Zener tunneling in indirect semiconductors

    Vandenberghe, William
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    Soree, Bart  
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    Fischetti, Massimo
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    Magnus, Wim  
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    Groeseneken, Guido  
    Meeting abstract
    2011, American Physical Society March Meeting, 21/03/2011, p.#D24.011
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    Modeling the capacitance-voltage response of In0.53Ga0.47As MOS structures : charge quantization and nonparabolic corrections

    O'Regan, Terrance
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    Hurley, Paul
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    Soree, Bart  
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    Fischetti, Massimo
    Journal article
    2010, Applied Physics Letters, (96) 21, p.213514
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    Monte Carlo study of carrier transport in two-dimensional transition metal dichalcogenides: high-field characteristics and MOSFET simulation

    Gopalan, Sanjay
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    Mansoori, Shoaib
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    Van de Put, Maarten  
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    Gaddemane, Gautam  
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    Fischetti, Massimo
    Journal article
    2023, JOURNAL OF COMPUTATIONAL ELECTRONICS, (22) 5, p.1240-1256
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    Overlaps in stacked graphene flakes using empirical pseudopotentials

    Van de Put, Maarten
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    Vandenberge, William
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    Magnus, Wim  
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    Soree, Bart  
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    Fischetti, Massimo
    Proceedings paper
    2015, International Workshop on Computational Electronics - IWCE, 2/09/2015, p.11-12
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    Physical modeling of strain-dependent hole mobility in Ge p-channel inversion layers

    Zhang, Yan
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    Fischetti, Massimo
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    Soree, Bart  
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    Magnus, Wim  
    ;
    Heyns, Marc  
    ;
    Meuris, Marc  
    Journal article
    2009, Journal of Applied Physics, (106) 8, p.83704
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    Si-based tunnel field-effect transistors for low-power nano-electronics

    Verhulst, Anne  
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    Vandenberghe, William
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    Leonelli, Daniele  
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    Rooyackers, Rita
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    Vandooren, Anne  
    Proceedings paper
    2011, 69th Device Research Conference, 20/06/2011, p.193-196
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    Theory of hole mobility in strained Ge and III-V p-channel inversion layers with high-kappa insulators

    Zhang, Yan
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    Fischetti, Massimo
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    Soree, Bart  
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    O'Regan, Terrance
    Journal article
    2010, Journal of Applied Physics, (108) 12, p.123713
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    Tunnel field-effect transistors for low-power nano-electronics

    Verhulst, Anne  
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    Vandenberghe, William
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    Leonelli, Daniele  
    ;
    Kao, Frank  
    ;
    Rooyackers, Rita
    Proceedings paper
    2011, Tsukuba Nanotechnology Symposium - TNS, 15/12/2011
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    Two-dimensional quantum mechanical modeling of band-to-band tunneling in indirect semiconductors

    Vandenberghe, William
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    Soree, Bart  
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    Magnus, Wim  
    ;
    Fischetti, Massimo
    ;
    Verhulst, Anne  
    Proceedings paper
    2011, IEEE International Electron Devices Meeting - IEDM, 5/12/2011, p.99-102

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