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Browsing by Author "Galloway, K.F."

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    Laser- and heavy ion-induced charge collection in bulk FinFETs

    El-Mamouni, F.
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    Zhang, E.X.
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    Pate, N.D.
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    Schrimpf, R.D.
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    Reed, R.A.
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    Galloway, K.F.
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    McMorrow, D.
    Journal article
    2011, IEEE Transactions on Nuclear Science, (58) 6,1, p.2563
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    Laser-induced current transients in bulk FinFETs

    El-Mamouni, F.
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    Zhang, E.X.
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    Hooten, N.
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    Schrimpf, R.D.
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    Reed, R.
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    Galloway, K.F.
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    McMarrow, D.
    Meeting abstract
    2011, Nuclear and Space Radiation Engineering Conference - NSREC, 25/07/2011
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    Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices

    El-Mamouni, F.
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    Zhang, E.X.
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    Schrimpf, R.D.
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    Reed, R.A.
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    Galloway, K.F.
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    McMorrow, D.
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    Simoen, Eddy  
    Proceedings paper
    2011, IEEE International Reliability Physics Symposium - IRPS, 10/04/2011, p.882-885
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    Radiation damage studies of strain-engineered and high-mobility deep submicrometer MOSFETs

    Simoen, Eddy  
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    Put, Sofie
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    Van Uffelen, Nick
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    Leroux, P.
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    Claeys, Cor
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    Ohyama, H.
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    Kulkarni, R.
    Oral presentation
    2008, 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications
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    Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio

    Kulkarni, S.R.
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    Schrimpf, R.D.
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    Galloway, K.F.
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    Claeys, Cor
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    Simoen, Eddy  
    Proceedings paper
    2008, 8th European Workshop on Radiation Effects on Components and Systems - RADECS, 10/09/2008, p.59-63
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    Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain

    Wang, L.
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    Zhang, E.X.
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    Zhang, C.X.
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    Duan, G.X.
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    Schrimpf, R.D.
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    Fleetwood, D.M.
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    Reed, R.A.
    Proceedings paper
    2015, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 13/07/2015, p.22-25
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    Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio

    Kulkarni, S.R.
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    Schrimpf, R.D.
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    Galloway, K.F.
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    Arora, R.
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    Claeys, Cor
    ;
    Simoen, Eddy  
    Journal article
    2009, IEEE Transactions on Nuclear Science, (56) 4, p.1926-1930

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