Browsing by Author "Gao, Rui"
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Publication A Pragmatic Model to Predict Future Device Aging
Publication An investigation on border traps in III-V MOSFETs with an In0.53Ga0.47As channel
Journal article2015, IEEE Transactions on Electron Devices, (62) 11, p.3633-3639Publication NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling
; Hatta, Sharifah Wan MuhamadJournal article2017, IEEE Transactions on Electron Devices, (64) 10, p.4011Publication Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Journal article2017, IEEE Transactions on Electron Devices, (64) 4, p.1467-1473Publication Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd