Browsing by Author "Gassot, Pierre"
Now showing 1 - 5 of 5
- Results Per Page
- Sort Options
Publication Analysis and application of energy capability characterization methods in power MOSFETs
Proceedings paper2004, Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC, 21/09/2004, p.453-456Publication Comprehensive study of postprocessed copper heat sinks on smart power drivers for thermal SOA improvement
Proceedings paper2005-04, Proceedings International Reliability Physics Symposium, 17/04/2005, p.652-653Publication Design and characterization of a post-processed copper heat sink for smart power drivers
Proceedings paper2005-04, IEEE International Conference on Microelectronic Test Structures, 4/04/2005, p.27-31Publication Wafer bevel protection during deep reactive ion etching
Journal article2011, IEEE Transactions on Semiconductor Manufacturing, (24) 2, p.358-365Publication Wafer bevel protection during deep reactive ion etching
Oral presentation2010, 13th Technical and Scientific Meeting of ARCSIS : 'Manufacturing Challenges in European Semiconductor Fabs'