Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Godfrin, Clement"

Filter results by typing the first few letters
Now showing 1 - 16 of 16
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    A flexible 300 mm integrated Si MOS platform for electron- and hole-spin qubits exploration

    Li, Roy  
    ;
    Dumoulin Stuyck, Nard  
    ;
    Kubicek, Stefan  
    ;
    Jussot, Julien  
    ;
    Chan, BT  
    Proceedings paper
    2020, IEEE International Electron Devices Meeting (IEDM), DEC 12-18, 2020
  • Loading...
    Thumbnail Image
    Publication

    A Scalable One Dimensional Silicon Qubit Array with Nanomagnets

    Simion, George  
    ;
    Mohiyaddin, Fahd Ayyalil  
    ;
    Li, Roy  
    ;
    Shehata, Mohamed
    ;
    Dumoulin Stuyck, Nard  
    Proceedings paper
    2020, IEEE International Electron Devices Meeting (IEDM), DEC 12-18, 2020
  • Loading...
    Thumbnail Image
    Publication

    Compressively strained epitaxial Ge layers for quantum computing applications

    Shimura, Yosuke  
    ;
    Godfrin, Clement  
    ;
    Hikavyy, Andriy  
    ;
    Li, Roy  
    ;
    Aguilera, Juan
    ;
    Katsaros, Georgios
    Journal article
    2024, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 174, p.Art. 108231
  • Loading...
    Thumbnail Image
    Publication

    Demonstration of 99.9% single qubit control fidelity of a silicon quantum dot spin qubit made in a 300 mm foundry process

    Dumoulin Stuyck, N.
    ;
    Feng, M. K.
    ;
    Lim, W. H.
    ;
    Serrano Ramirez, S.
    ;
    Escott, C. C.
    ;
    Botzem, T.
    ;
    Tanttu, T.
    Proceedings paper
    2024, IEEE Silicon Nanoelectronics Workshop (SNW) / Symposium on VLSI Technology and Circuits, 2024-06-15, p.11-12
  • Loading...
    Thumbnail Image
    Publication

    Experimental Online Quantum Dots Charge Autotuning Using Neural Networks

    Yon, Victor
    ;
    Galaup, Bastien
    ;
    Rohrbacher, Claude
    ;
    Rivard, Joffrey
    ;
    Morel, Alexis
    Journal article
    2025-FEB 27, NANO LETTERS
  • Loading...
    Thumbnail Image
    Publication

    Industrial 300 mm wafer processed spin qubits in natural silicon/silicon-germanium

    Koch, Thomas
    ;
    Godfrin, Clement
    ;
    Adam, Viktor
    ;
    Ferrero, Julian
    ;
    Schroller, Daniel
    ;
    Glaeser, Noah
    Journal article
    2025-APR 5, NPJ QUANTUM INFORMATION, (11) 1
  • Loading...
    Thumbnail Image
    Publication

    Large-Scale 2D Spin-Based Quantum Processor with a Bi-Linear Architecture

    Mohiyaddin, Fahd Ayyalil  
    ;
    Li, Roy  
    ;
    Brebels, Steven  
    ;
    Simion, George  
    ;
    Dumoulin Stuyck, Nard  
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021
  • Loading...
    Thumbnail Image
    Publication

    Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications

    Kao, K-H
    ;
    Godfrin, Clement  
    ;
    Elsayed, Asser  
    ;
    Li, Roy  
    ;
    Simoen, Eddy  
    ;
    Grill, Alexander  
    ;
    Kubicek, Stefan  
    Journal article
    2022, IEEE ELECTRON DEVICE LETTERS, (43) 5, p.674-677
  • Loading...
    Thumbnail Image
    Publication

    Low charge noise quantum dots with industrial CMOS manufacturing

    Elsayed, Asser  
    ;
    Shehata, M. M. K.
    ;
    Godfrin, Clement  
    ;
    Kubicek, Stefan  
    ;
    Massar, Shana  
    ;
    Canvel, Yann  
    Journal article
    2024-JUL 19, NPJ QUANTUM INFORMATION, (10) 1, p.70
  • Loading...
    Thumbnail Image
    Publication

    Robust quantum dots charge autotuning using neural network uncertainty

    Yon, Victor
    ;
    Galaup, Bastien
    ;
    Rohrbacher, Claude
    ;
    Rivard, Joffrey
    ;
    Godfrin, Clement  
    ;
    Li, Ruoyu
    Journal article
    2024, MACHINE LEARNING-SCIENCE AND TECHNOLOGY, (5) 4, p.Art. 045034
  • Loading...
    Thumbnail Image
    Publication

    Statistical analysis of spurious dot formation in silicon metal-oxide-semiconductor single electron transistors

    Chen, Kuan-Chu
    ;
    Godfrin, Clement  
    ;
    Simion, George  
    ;
    Fattal, Imri  
    ;
    Jussot, Julien  
    ;
    Kubicek, Stefan  
    Journal article
    2025-MAR 5, PHYSICAL REVIEW B, (111) 12
  • Loading...
    Thumbnail Image
    Publication

    Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

    Lorenzelli, Francesco  
    ;
    Elsayed, Asser  
    ;
    Godfrin, Clement  
    ;
    Grill, Alexander  
    ;
    Kubicek, Stefan  
    Proceedings paper
    2023, 28th IEEE European Test Symposium (ETS), MAY 22-26, 2023
  • Loading...
    Thumbnail Image
    Publication

    TCAD-Assisted MultiPhysics Modeling & Simulation for Accelerating Silicon Quantum Dot Qubit Design

    Mohiyaddin, Fahd Ayyalil  
    ;
    Simion, George  
    ;
    Dumoulin Stuyck, Nard  
    ;
    Li, Roy  
    ;
    Elsayed, Asser  
    Proceedings paper
    2020, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), SEP 23-OCT 06, 2020, p.253-256
  • Loading...
    Thumbnail Image
    Publication

    Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design

    Lorenzelli, Francesco  
    ;
    Chen, Kuan-Chu
    ;
    Godfrin, Clement  
    ;
    Stucchi, Michele  
    ;
    Grill, Alexander  
    Journal article
    2025-JUN 17, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 8, p.4506-4514
  • Loading...
    Thumbnail Image
    Publication

    Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures

    Lorenzelli, Francesco  
    ;
    Godfrin, Clement  
    ;
    Stucchi, Michele  
    ;
    Grill, Alexander  
    ;
    Li, Ruoyu
    Letter
    2024, 45, p.2217-2220
  • Loading...
    Thumbnail Image
    Publication

    Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures

    Lorenzelli, Francesco  
    ;
    Elsayed, Asser  
    ;
    Godfrin, Clement  
    ;
    Grill, Alexander  
    ;
    Kubicek, Stefan  
    Proceedings paper
    2023-12-22, 2023 IEEE International Test Conference (ITC), 07-15 October 2023

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings