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Browsing by Author "Grau, Lluis"

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    Elevated co-silicide for sub-100nm high performance and RF CMOS

    Jurczak, Gosia  
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    de Potter de ten Broeck, Muriel  
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    Rooyackers, Rita
    ;
    Jeamsaksiri, Wutthinan
    Proceedings paper
    2002, ESSDERC - 32nd European Solid-State Device Research Conference, 24/09/2002, p.311-314
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    Gate-source-drain architecture impact on DC and performance of sub-100-nm elevated source/drain NMOS transistors

    Jeamsaksiri, Wutthinan
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    Jurczak, Gosia  
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    Grau, Lluis
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    Linten, Dimitri  
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    Augendre, Emmanuel
    Journal article
    2003, IEEE Trans. Electron Devices, (50) 3, p.610-617
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    Optimisation of active area edge protection in shallow trench isolation

    Augendre, Emmanuel
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    Rooyackers, Rita
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    Pochet, Sandrine
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    Grau, Lluis
    ;
    Sleeckx, Erik  
    Proceedings paper
    2001, ULSI Process Integration II; 26 March 2001; Washington, D.C., USA., p.539-546
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    Processing factors influencing the leakage current in shallow junction diodes for deep submicro-meter CMOS

    Grau, Lluis
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    Augendre, Emmanuel
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    Simoen, Eddy  
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    Rooyackers, Rita
    ;
    Claeys, C.
    ;
    Badenes, Gonçal
    Journal article
    2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.211-14
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    Processing factors influencing the leakage current in shallow junction diodes for deep submicron CMOS

    Grau, Lluis
    ;
    Augendre, Emmanuel
    ;
    Simoen, Eddy  
    ;
    Rooyackers, Rita
    ;
    Claeys, Cor
    ;
    Badenes, Gonçal
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.11-14
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    The RF potential of high-performance 100nm CMOS technology

    Venezia, Vincent
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    Scholten, A.J.
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    Detcheverry, Celine
    ;
    Boots, Henk
    ;
    Jeamsaksiri, Wutthinan
    Proceedings paper
    2002, ESSDERC - 32nd European Solid-State Device Research Conference, 24/09/2002, p.491-494

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