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Browsing by Author "Hangen, Ude"

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    Assessment of mechanical properties in nanotechnology: porous low-k dielectrics, TSVs and bumps

    Vanstreels, Kris  
    ;
    De Wolf, Ingrid  
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    Hangen, Ude
    Meeting abstract
    2013, Nanobrueken-Dresden. A Nanomechanical Testing Workshop & Hysitron User Meeting, 20/03/2013
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    Determination of thermal expansion coefficients of low-k dielectrics by cube corner indentation tests at elevated temperatures

    Vanstreels, Kris  
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    Zahedmanesh, Houman  
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    Verdonck, Patrick  
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    Hangen, Ude
    ;
    Baklanov, Mikhaïl
    Meeting abstract
    2016, Materials for Advanced Metallization Conference - MAM, 20/03/2016, p.61-62
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    Extraction of elastic modulus of porous ultra-thin low-k films by two-dimensional finite-element simulations of nanoindentation

    Okudur, Oguzhan Orkut  
    ;
    Vanstreels, Kris  
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    De Wolf, Ingrid  
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    Hangen, Ude
    Journal article
    2016, Journal of Applied Physics, (119) 2, p.25302
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    Mechanical behavior of porous thin low-k films during nanoindentation

    Okudur, Oguzhan Orkut  
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    Vanstreels, Kris  
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    Saleh, Ahmed Sobhi
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    Hangen, Ude
    ;
    De Wolf, Ingrid  
    Meeting abstract
    2019, Nanobruecken 2019, 19/02/2019
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    Substrate independent elastic modulus of thin low dielectric constant materials

    Okudur, Oguzhan Orkut  
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    Vanstreels, Kris  
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    De Wolf, Ingrid  
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    Hangen, Ude
    ;
    Qiu, Anqi
    Journal article
    2017, Advanced Engineering Materials, (19) 8, p.1600653
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    Substrate independent mechanical properties of thin low dielectric constant materials

    Okudur, Oguzhan Orkut  
    ;
    Vanstreels, Kris  
    ;
    Hangen, Ude
    ;
    Qui, Anqi
    ;
    De Wolf, Ingrid  
    Meeting abstract
    2016, Materials for Advanced Metallization - MAM, 20/03/2016, p.63-64
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    Thermal expansion coefficients of ultralow-k dielectric films by cube corner indentation tests at elevated temperatures

    Vanstreels, Kris  
    ;
    Zahedmanesh, Houman  
    ;
    Hangen, Ude
    Journal article
    2015, Applied Physics Letters, (107) 23, p.233101

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