Browsing by Author "Henson, W. K."
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Publication A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides
Publication Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
Publication Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Proceedings paper1999, International Electron Devices Meeting. Technical Digest; 5-8 Dec. 1999; Washington, D.C., USA., p.823-826Publication Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFETs