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Browsing by Author "Hong, M."

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    Approaching Fermi level unpinning in oxide-In0.2Ga0.8As

    Chiang, T.H.
    ;
    Lee, W.C.
    ;
    Lin, T.D.
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    Lin, Dennis  
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    Shiu, K.H.
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    Kwo, J.
    ;
    Wang, W.E.
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    Tsai, W.
    ;
    Hong, M.
    Proceedings paper
    2008, IEEE International Electron Devices Meeting - IEDM, 15/12/2008, p.375-378
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    Asymptotic uncertainty of transfer function estimates using non-parametric noise models

    Pintelon, Rik
    ;
    Hong, M.
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Asymptotic uncertainty of transfer-function estimates using nonparametric noise models

    Pintelon, R.
    ;
    Hong, M.
    Journal article
    2007, IEEE Trans. Instrumentation and Measurement, (56) 6, p.2599-2605
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    Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation

    Merckling, Clement  
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    Chang, Y.C.
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    Lu, C.Y.
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    Penaud, J.
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    Brammertz, Guy  
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    Scarrozza, Marco
    Journal article
    2011, Surface Science, (605) 19_20, p.1778-1783
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    Low interfacial trap density and sub-nm equivalent oxide thickness in In0.53Ga0.47As (001) metal-oxide-semiconductor devices using molecular beam deposited HfO2/Al2O3 as gate dielectrics

    Chu, L.K.
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    Merckling, Clement  
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    Alian, AliReza  
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    Dekoster, Johan  
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    Kwo, J.
    ;
    Hong, M.
    ;
    Caymax, Matty  
    Journal article
    2011, Applied Physics Letters, (99) 4, p.42908
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    Metal oxide semiconductor devices studies of molecula- beam-deposited Al2O3/InP heterostructures with various surface orientations (001), (110), and (111)

    Chu, Eric
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    Merckling, Clement  
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    Dekoster, Johan  
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    Kwo, R.
    ;
    Hong, M.
    ;
    Caymax, Matty  
    ;
    Heyns, Marc  
    Journal article
    2012, Applied Physics Express, (5) 6, p.61202

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