Browsing by Author "Hong, Sug-Hun"
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Publication 1mA/μm-ION strained SiGe45%-IFQW pFETs with raised and embedded S/D
; ; ; ; Proceedings paper2011, Symposium on VLSI Technology, 13/06/2011, p.134-135Publication Gate-last vs. gate-first technology for aggressively scaled EOT Logic/RF CMOS
Proceedings paper2011, Symposium on VLSI Technology, 13/06/2011, p.34-35Publication On the origin of mobility reduction in ultrathin EOT HK/MG CMOS devices: Impact from gate-stack and device architecture
Proceedings paper2011, International Workshop on Dielectric Thin Films for Future Electron Devices: Science and Technology - IWDTF-11, 20/01/2011, p.1-4Publication On the origin of the mobility reduction in bulk-Si, UTBOX-FDSOI and SiGe devices with ultrathin-EOT dielectrics
Proceedings paper2011, International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA, 25/04/2011, p.116-117