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Browsing by Author "Horsfall, A.B."

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    Application of a nano-mechanical sensor to monitor stress in copper damascene interconnects

    Wilson, Chris  
    ;
    Croes, Kristof  
    ;
    Tokei, Zsolt  
    ;
    Vereecke, Bart  
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    Beyer, Gerald  
    ;
    O'Neill, A.G.
    Journal article
    2009, Applied Physics Express, (2) 9, p.96503
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    In-situ growth of Cu-Mn alloy self-forming barriers in 100 nm Cu/Low-k damascene interconnects

    Wilson, Chris  
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    Volders, Henny  
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    Tokei, Zsolt  
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    Croes, Kristof  
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    Pantouvaki, Marianna  
    ;
    Beyer, Gerald  
    Oral presentation
    2009, 18th Workshop Materials for Advanced Metallization - MAM
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    Study of the effect of dielectric porosity on the stress in advanced Cu/low-k interconnects using x-ray diffraction

    Wilson, Chris  
    ;
    Zhao, Chao
    ;
    Zhao, Larry
    ;
    Metzger, T.H.
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    Tokei, Zsolt  
    ;
    Croes, Kristof  
    Journal article
    2009, Applied Physics Letters, (94) 18, p.181914
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    Synchrotron measurement of the effect of line-width scaling on stress in advanced Cu/Low-k interconnects

    Wilson, Chris  
    ;
    Croes, Kristof  
    ;
    Zhao, Chao
    ;
    Metzger, T.H.
    ;
    Zhao, Larry
    ;
    Beyer, Gerald  
    Journal article
    2009, Journal of Applied Physics, (106) 5, p.53524

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