Browsing by Author "Hytch, Martin"
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Publication Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Journal article2008, Physical Review Letters, (100) 15, p.156602Publication Strain mapping in MOSFETs by transmission electron microscopy
Proceedings paper2008, 9th International Conference on Ultimate Integration of Silicon - ULIS, 12/03/2008, p.85-87Publication Strain mapping of tensile strained silicon transistors with embedded Si1yCy source and drain by dark-field holography
Journal article2009, Applied Physics Letters, (95) 7, p.73103Publication Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Proceedings paper2008-09, 14th European Microscopy Congress, 1/09/2008, p.123-124