Browsing by Author "Ji, Yunhyuck"

CMOS integration of high-k/metal gate transistors in diffusion and gate replacement (D&GR) scheme for dynamic random access memory peripheral circuits

CMOS integration of thermally stable diffusion and gate replacement (D&GR) high-k/metal gate stacks in DRAM periphery transistors

Improving the low-frequency noise performance of input/output DRAM peripheral pMOSFETs

Overview of bias temperature instability in scaled DRAM logic for memory transistors

Reliability engineering enabling continued logic for memory device scaling