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Browsing by Author "Ke, Xiaoxing"

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    3D analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artefacts

    Ke, Xiaoxing
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    Bals, Sarah
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    Cott, Daire  
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    Hantschel, Thomas  
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    Bender, Hugo  
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    Van Tendeloo, Gustaaf
    Journal article
    2010, Microscopy and Microanalysis, 16, p.210-217
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    Can carbon nanotubes be preserved during FIB preparation of TEM samples?

    Ke, Xiaoxing
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    Bals, Sara
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    Van Tenderloo, Gustaaf
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    Romo Negreira, Ainhoa  
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    Hantschel, Thomas  
    Proceedings paper
    2008, 4th European FIB & DualBeam User Club Meeting, 7/04/2008
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    Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?

    Ke, Xiaoxing
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    Bals, Sara
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    Romo Negreira, Ainhoa  
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    Hantschel, Thomas  
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    Bender, Hugo  
    Proceedings paper
    2008-09, 14th European Microscopy Congress, 1/09/2008, p.673-674
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    Electrical and structural characterization of 150 nm CNT contacts with Cu damascene top metallization

    van der Veen, Marleen  
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    Vereecke, Bart  
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    Masahito, Sugiura
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    Kashiwagi, Yusaku
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    Ke, Xiaoxing
    Proceedings paper
    2012, IEEE International Interconnect Technology Conference - IITC, 4/06/2012
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    Electrical characterization of carbon nanotube based interconnects

    Schulze, Andreas
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    Hantschel, Thomas  
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    Eyben, Pierre  
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    Dathe, Andre
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    Nazir, Aftab  
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    Mody, Jay
    Proceedings paper
    2011, BeNeLux SPM User meeting, 9/11/2011
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    Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

    Schulze, Andreas
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    Hantschel, Thomas  
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    Dathe, Andre
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    Eyben, Pierre  
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    Ke, Xiaoxing
    Journal article
    2012-07, Nanotechnology, (23) 30, p.305707
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    From 2D to 3D: FIB sample preparation for carbon nanotube interconnects

    Ke, Xiaoxing
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    Bals, Sarah
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    Romo Negreira, Ainhoa  
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    Cott, Daire  
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    Hantschel, Thomas  
    ;
    Bender, Hugo  
    Proceedings paper
    2010, 17th International Microscopy Congress, 20/09/2010
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    Structural and electrical characterization of carbon nanotube interconnects by combined transmission electron microscopy and scanning spreading resistance microscopy

    Hantschel, Thomas  
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    Ke, Xiaoxing
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    Chiodarelli, Nicolo
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    Schulze, Andreas
    ;
    Bender, Hugo  
    Proceedings paper
    2011, Quantitative Characterization of Nanostructured Materials, 25/04/2011, p.1349-dd04.09
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    TEM sample preparation by FIB for carbon nanotube interconnects

    Ke, Xiaoxing
    ;
    Bals, Sara
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    Romo Negreira, Ainhoa  
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    Hantschel, Thomas  
    ;
    Bender, Hugo  
    Journal article
    2009, Ultramicroscopy, (109) 11, p.1353-1359
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    TEM study of carbon nanotube interconnects

    Ke, Xiaoxing
    ;
    Chiodarelli, Nicolo
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    van der Veen, Marleen  
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    Vereecke, Bart  
    ;
    Hantschel, Thomas  
    Meeting abstract
    2011, Workshop on Graphene and Carbon Nanotubes, 23/09/2011
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    Three-dimensional electrical profiling of carbon nanotube interconnects

    Hantschel, Thomas  
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    Schulze, Andreas
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    Dathe, Andre
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    Eyben, Pierre  
    ;
    van der Veen, Marleen  
    Meeting abstract
    2012, MRS Spring Meeting Symposium DD: De Novo Carbon Materials, 9/04/2012, p.DD15.32
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    Unconventional Giant "Magnetoresistance" in Bosonic Semiconducting Diamond Nanorings

    Zhang, Gufei
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    Zulkharnay, Ramiz
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    Ke, Xiaoxing
    ;
    Liao, Meiyong
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    Liu, Liwang
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    Guo, Yujie  
    ;
    Li, Yejun
    Journal article
    2023, ADVANCED MATERIALS, (35) 22, p.Art. 2211129
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    Wafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature

    Vereecke, Bart  
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    van der Veen, Marleen  
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    Sugiura, Masahito
    ;
    Kashiwagi, Yusaku
    ;
    Ke, Xiaoxing
    Journal article
    2013, Japanese Journal of Applied Physics, (52) 4, p.04CN02

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