Browsing by Author "Kerber, A."
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Publication Charge trapping in SiO2/HfO2 dual layer gate stacks
Publication Charge trapping in SiO2/HfO2 gate dielctrics: comparison between charge-pumping and pulsed I-D-V-G
Journal article2004, Microelectronic Engineering, (72) 1_4, p.267-272Publication Issues, achievements and challenges towards intergration of high-k dielectrics
Proceedings paper2002, 5th International Forum on Semiconductor Technology - IFST, 21/02/2002Publication Reliability screening oh high-k dielectrics based on voltage ramp stress
Journal article2007, Microelectronics Reliability, (47) 4_5, p.513-517Publication Scaling of Hf-based high-k dielectrics
Meeting abstract2004, International Workshop on Dielectric Thin Films for Future ULSI Devices, 26/05/2004, p.5-6