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Browsing by Author "Kim, Daeyong"

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    1.5×10-9 Ω·cm² Contact Resistivity on Highly Doped Si:P Using Ge Pre-amorphization and Ti Silicidation

    Yu, Hao  
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    Schaekers, Marc  
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    Rosseel, Erik  
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    Peter, Antony  
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    Lee, Joon-Gon
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    Song, Woo-Bin
    Proceedings paper
    2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.592-595
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    A new direction for III-V FETs for mobile CPU operation uncluding burst-mode: In0.35Ga0.65As channel

    Rakshit, T.
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    Obradovic, B.
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    Wang, W.-E.
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    Kim, Weon Hong
    ;
    Shin, Keo Myoung
    ;
    Baek, Seongcheol
    Journal article
    2017, IEEE Transactions on Electron Devices, (38) 3, p.314-317
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    Titanium silicide on Si:P with precontact amorphization implantation treatment: contact resistivity approaching 1×10-9 Ohm-cm²

    Yu, Hao  
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    Schaekers, Marc  
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    Peter, Antony  
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    Pourtois, Geoffrey  
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    Rosseel, Erik  
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    Lee, Joon-Gon
    Journal article
    2016, IEEE Transactions on Electron Devices, (63) 12, p.4632-4641
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    Ultralow-resistivity CMOS contact scheme with pre-contact amorphization plus Ti (germano-)silicidation

    Yu, Hao  
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    Schaekers, Marc  
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    Hikavyy, Andriy  
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    Rosseel, Erik  
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    Peter, Antony  
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    Hollar, K.
    ;
    Khaja, Fareen
    Proceedings paper
    2016, IEEE Symposium on VLSI Technology, 13/06/2016, p.66-67

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