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Browsing by Author "Kitano, Junichi"

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    EUV process sensitivities and optimizations for track processing

    Shite, Hideo
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    Bradon, Neil
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    Nafus, Kathleen  
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    Kitano, Junichi
    ;
    Kosugi, Hitoshi
    ;
    Hermans, Jan  
    Proceedings paper
    2010, International Symposium on Extreme Ultraviolet Lithography, 18/10/2010
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    EUV reolution-LWR-sensitivity performance tradeoffs for a polymer bound PAG resist

    Gronheid, Roel  
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    Vaglio Pret, Alessandro  
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    Rathsack, Benjamin
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    Hooge, Joshua
    ;
    Scheer, Steven  
    Oral presentation
    2010, 54th International conference on Electron, Ion and Photon Beam Technology and Nanofabrication - EIPBN
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    EUV RLS performance tradeoffs for a polymer bound PAG resist

    Gronheid, Roel  
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    Vaglio Pret, Alessandro  
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    Rathsack, Benjamin
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    Hooge, Joshua
    ;
    Scheer, Steven  
    Proceedings paper
    2010, Advances in Resist Materials and Processing Technology XXVII, 21/02/2010, p.76390M
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    EUV RLS performance tradeoffs for a polymer bound PAG resist process

    Rathsack, Ben
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    Hooge, Josh
    ;
    Somervell, Mark
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    Scheer, Steve
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    Nafus, Kathleen  
    ;
    Shite, Hideo
    Proceedings paper
    2009, International Symposium on Extreme Ultraviolet Lithography, 18/10/2009
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    Finite element modeling of PAG leaching and water uptake in immersion lithography resist materials

    Rathsack, Ben
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    Scheer, Steven  
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    Kuwahara, Yuhei
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    Kitano, Junichi
    ;
    Gronheid, Roel  
    Proceedings paper
    2008, Advances in Resist Materials and Processing Technology XXV, 24/02/2008, p.692315
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    Image contrast contributions to immersion lithography defect formation and process yield

    Rathsack, Ben
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    Hooge, Joshua
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    Scheer, Steven  
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    Nafus, Kathleen  
    ;
    Hatakeyama, Shinichi
    Proceedings paper
    2008, Optical Microlithography XXI, 24/02/2008, p.69244W
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    LWR reduction by novel lithographic and etch techniques

    Kobayashi, Shinji
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    Shimura, Satoru
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    Kawasaki, Tetsu
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    Nafus, Kathleen  
    ;
    Hatakeyama, Shinichi
    Proceedings paper
    2010, Advances in Resist Materials and Processing Technology XXVII, 21/02/2010, p.763914
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    Resist fundamentals for resolution, LER and sensitivity (RLS) performance tradeoffs and their relation to micro-bridging defects

    Rathsack, Benjamin
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    Nafus, Kathleen  
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    Hatakeyama, Shinichi
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    Kuwahara, Yuhei
    ;
    Kitano, Junichi
    Proceedings paper
    2009, Advances in Resist Materials and Processing Technology XXVI, 22/02/2009, p.727347
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    Resolution-linewidth roughness-sensitivity performance tradeoffs for an extreme ultraviolet polymer bound photo-acid generator resist

    Gronheid, Roel  
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    Vaglio Pret, Alessandro  
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    Rathsack, Benjamin
    ;
    Hooge, Joshua
    ;
    Scheer, Steven  
    Journal article
    2011, Journal of Micro/Nanolithography MEMS and MOEMS, (10) 1, p.13017

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