imec Institutional Repository Browsing {{ collection }} by Author "Knobloch, T."

Publication

COMPHY - A compact-physics framework for unified modeling of BTI

Rzepa, Gerhard

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Subirats, Alexandre

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Journal article

2018, Microelectronics Reliability, 85, p.49-65

Publication

Efficient physical defect model applied to PBTI in high-k stacks

Rzepa, G.

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Subirats, Alexandre

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Jech, M.

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Grill, A.

Proceedings paper

2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-11.1-XT-11.6

Publication

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Michl, J.

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Stampfer, B.

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Waldhoer, D.

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Schleich, C.

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Knobloch, T.

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Ioannidis, E.

Proceedings paper

2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021

Browsing by Author "Knobloch, T."