Browsing by Author "Kraak, Daniel"
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Publication Degradation analysis of high performance 14nm FinFET SRAM
Proceedings paper2018, 21th ACM/IEEE Design and Test in Europe Conference- DATE, 19/03/2018, p.201-206Publication Device aging: A reliability and security concern
Proceedings paper2018, IEEE 23rd European Test Symposium (ETS), 28/05/2018, p.1-10Publication eSRAM Reliability: Why is it still not optimally solved?
Proceedings paper2020, 15th Intnl. Conf. on Design Technology of Integrated Systems 0n Nanoscale Era (DTIS), 1/10/2020, p.1-6Publication Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability
Oral presentation2017, ICT Open WorkshopPublication Hardware-based aging mitigation scheme for memory address decoder
Proceedings paper2019, 24th IEEE European Test Symposium (ETS), 2/05/2019, p.1-6Publication Impact and mitigation of sense amplifier aging degradation using realistic workloads
Journal article2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (25) 12, p.319-327Publication Impact and mitigation of SRAM read path aging
Journal article2018, Microelectronics Reliability, 87, p.158-167Publication Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier
Journal article2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (25) 4, p.1444-1454Publication Memory Reliability Analysis Framework: Modeling and Mitigation
Kraak, DanielPHD thesis2020Publication Methodology for application-dependent degradation analysis of memory timing
Proceedings paper2019, 22nd ACM/IEEE Design, Automation and Test in Europe Conference (DATE), 2/03/2019, p.162-167Publication Mitigation of sense amplifier degradation using input switching
Proceedings paper2017, 20th ACM/IEEE Design and Test in Europe Conference - DATE, 28/03/2017, p.858-863Publication Mitigation of Sense Amplifier Degradation Using Skewed Design
Proceedings paper2020, Design, Automation and Test in Europe Conference and Exhibition (DATE), MAR 09-13, 2020, p.1614-1617Publication Parametric and functional degradation analysis of complete 14-nm FinFET SRAM
Journal article2019, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (27) 6, p.1308-1321Publication Sense amplifier offset voltage analysis for both time-zero and time-dependent variability
Journal article2019, Microelectronics Reliability, 99, p.52-61Publication Sense amplifier offset voltage mitigation under presence of BTI
Proceedings paper2017, Workshop on Reliability, Security and Quality - RESCUE, 22/05/2017