Browsing by Author "Kretz, J."

Now showing 1 - 6 of 6

Fabrication and characterization of full diamond tips for scanning-spreading resistance microscopy

Alvarez, David
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Fouchier, Marc
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Kretz, J.
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Hartwich, J.
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Schoemann, S.
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Vandervorst, Wilfried
Journal article
2004-06, Microelectronic Engineering, 73-74, p.910-915
High resolution 2D scanning spreading resistance microscopy (SSRM) of thin film SOI MOSFETs with ultra short effective channel length

Hartwich, J.
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Alvarez, David
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Dreeskornfeld, L.
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Hoffman, F.
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Kretz, J.
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Landgraf, E.
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Luyken, R.J.
Proceedings paper
2003, IEEE International SOI Conference, 29/09/2003, p.35-36
High-resolution scanning spreading resistance microscopy of surrounding-gate transistors

Alvarez, D.
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Schömann, S.
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Goebel, B.
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Manger, D.
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Schlösser, T.
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Slesazeck, S.
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Hartwich, J.
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Kretz, J.
Journal article
2004-01, Journal of Vacuum Science and Technology B, (22) 1, p.377-380
Scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices

Alvarez, David
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Hartwich, J.
;
Kretz, J.
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Fouchier, Marc
;
Vandervorst, Wilfried
Journal article
2003, Microelectronic Engineering, 67-68, p.945-950
Scanning spreading resistance microscopy of fully depleted SOI devices

Alvarez, David
;
Hartwich, J.
;
Kretz, J.
;
Fouchier, Marc
Oral presentation
2002, Micro- and Nano-Engineering - MNE
Scanning spreading resistance microscopy of two-dimensional diffusion of boron implanted in free-standing silicon nanostructures

Kluth, S.M.
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Alvarez, C.
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Trellenkamp, St.
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Moers, J.
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Mantl, S.
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Kretz, J.
;
Vandervorst, Wilfried
Journal article
2005, Journal of Vacuum Science & Technology B, (23) 1, p.76-79