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Browsing by Author "La Tulipe, Douglas Charles"

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    A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps

    Derakhshandeh, Jaber  
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    Gerets, Carine  
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    Inoue, Fumihiro  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124
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    Confined IMCs for low temperature and high throughput D2W bonding

    Derakhshandeh, Jaber  
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    La Tulipe, Douglas Charles  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2022, International Conference on Electronics Packaging (ICEP), MAY 11-14, 2022, p.131-132
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    Demonstration of a collective hybrid die-to-wafer integration using glass carrier

    Suhard, Samuel  
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    Kennes, Koen  
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    Bex, Pieter  
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    Jourdain, Anne  
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    Teugels, Lieve  
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    Walsby, Edward
    Proceedings paper
    2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.2064-2070
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    Fundamental study of IMC grains at low anneal temperature

    Gerets, Carine  
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    Derakhshandeh, Jaber  
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    Shafahian, Ehsan  
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    Cochet, Tom  
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    La Tulipe, Douglas Charles  
    Proceedings paper
    2022, International Conference on Electronics Packaging (ICEP), MAY 11-14, 2022, p.133-134
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    Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking

    Derakhshandeh, Jaber  
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    Beyne, Eric  
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    Beyer, Gerald  
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    Capuz, Giovanni  
    ;
    Cherman, Vladimir  
    Proceedings paper
    2022, 72nd IEEE Electronic Components and Technology Conference (ECTC), MAY 31-JUN 01, 2022, p.1108-1113
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    Overlay challenges in 3D heterogeneous integration

    Grauer, Yoav
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    Miller, Andy  
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    La Tulipe, Douglas Charles  
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    Manassen, Amnon
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    Eisenbach, Shlomo
    Proceedings paper
    2022, Conference on Metrology, Inspection, and Process Control XXXVI Part of SPIE Advanced Lithography and Patterning Conference, FEB 24-MAY 27, 2022, p.Art. 120530D
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    Wafer-Scale Hybrid Integration of InP DFB Lasers on Si Photonics by Flip-Chip Bonding With sub-300 nm Alignment Precision

    Marinins, Aleksandrs  
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    Hansch, Sebastian
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    Sar, Huseyin  
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    Chancerel, Francois  
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    Golshani, Negin  
    Journal article
    2023, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, (29) 6, p.Art. 8200311

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