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Browsing by Author "Labie, Riet"

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    18% efficiency IBC cell with rear-surface processed on quartz

    Dross, Frederic
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    O'Sullivan, Barry  
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    Debucquoy, Maarten  
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    Bearda, Twan
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    Govaerts, Jonathan  
    Journal article
    2013, IEEE Journal of Photovoltaics, (3) 2, p.684-689
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    A PoF based methodology to assess the reliability of a sensor module operating in harsh industrial environments

    Nawghane, Chinmay  
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    Vandevelde, Bart  
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    Labie, Riet  
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    Michiels, Sam
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    Hughes, Danny
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    Liu, Mengyao
    Proceedings paper
    2022-04-20, 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), APR 25-27, 2022
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    A simple copper metallisation process for high cell efficiencies and reliable modules

    Russell, Richard
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    Tous, Loic  
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    Philipsen, Harold  
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    Horzel, Jörg
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    Cornagliotti, Emanuele  
    Proceedings paper
    2012, 27th European Photovoltaic Solar Energy Conference and Exhibition - EUPVSEC, 24/10/2012, p.538-543
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    BGA electromigration behavior and why it has become the bottleneck

    Labie, Riet  
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    Nawghane, Chinmay  
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    Tsiakos, Dimitrios  
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    Mertens, Jan  
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    Tremble, Eric
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    Graf, Richard
    Proceedings paper
    2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.678-684
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    Bleifrei in die Gehäusezukunft

    Parton, Els  
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    Gonzalez, Mario  
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    Labie, Riet  
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    Vandevelde, Bart  
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    Vanfleteren, Jan  
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    Ratchev, Petar
    Journal article
    2004, D & V Kompendium 2004/2005, p.89-94
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    Bleifrei in die Gehäusezukunft

    Parton, Els  
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    Gonzalez, Mario  
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    Labie, Riet  
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    Vandevelde, Bart  
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    Vanfleteren, Jan  
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    Ratchev, Petar
    Journal article
    2003-12, Productronic, 12, p.2-5
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    Board-level solder intermetallic strength measurements using mini-Charpy shock testing and FEM calibration

    Labie, Riet  
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    Duflos, Frederic
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    Vandevelde, Bart  
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    Allaert, Bart
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    Lauwaert, Ralph
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    Willems, Geert  
    Proceedings paper
    2018, 19th Int. Conf. Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics & Microsysystems - EuroSimE, 16/04/2018, p.1-6
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    Bond pad pitch reduction down to 40 μm: influence on solder joint fatigue for flip chip structures

    Degryse, Dominiek
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    Labie, Riet  
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    Vandevelde, Bart  
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    Gonzalez, M.
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    Beyne, Eric  
    Proceedings paper
    2002, Proceedings of the 3rd Eurosime Conference, 14/04/2002, p.316-321
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    Cell-module integration concept compatible with c-Si epitaxial thin foils and with efficiencies over 18%

    Dross, Frederic
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    Van Nieuwenhuysen, Kris
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    Bearda, Twan
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    Debucquoy, Maarten  
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    Depauw, Valerie  
    Proceedings paper
    2012, 27th European Photovoltaic Solar Energy Conference and Exhibition - EUPVSEC, 24/09/2012, p.2207-2211
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    Comparison of a Cu UBM versus a Co UBM for Sn flip chip bumps

    Labie, Riet  
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    Ratchev, Petar
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    Beyne, Eric  
    Proceedings paper
    2005-06, Proceeding of the 2005 Electronic Components and Technology conference ECTC '05. Proceedings, 31/05/2005, p.449-451
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    Cost-effective and reliable Ni/Cu plating for p- and n-type PERx silicon solar cells

    Russell, Richard
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    Tous, Loic  
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    Labie, Riet  
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    Aleman, Monica  
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    Duerinckx, Filip  
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    Bertens, Jurgen
    Journal article
    2013, Photovoltaics International. The Technology Resource for PV Professionals, 21, p.62
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    Creep behavior of mixed SAC 405/ SnPb soldered assemblies in shear loading

    Limaye, Paresh
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    Labie, Riet  
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    Vandevelde, Bart  
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    Vandepitte, Dirk
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    Verlinden, Bert
    Proceedings paper
    2007, 9th Electronics Packaging Technology Conference - EPTC, 10/12/2007, p.703-712
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    Crystalline thin-foil silicon solar cells: where crystalline quality meets thin-film processing

    Dross, Frederic
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    Baert, Kris
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    Bearda, Twan
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    Deckers, Jan
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    Depauw, Valerie  
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    El Daif, Ounsi
    Journal article
    2012, Progress in Photovoltaics Research and Applications, (20) 6, p.770-784
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    Cu plated I-perl cells: ageing and humidity reliability tests

    Labie, Riet  
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    Hernandez, Jose Luis  
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    Govaerts, Jonathan  
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    Allebe, Christophe
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    Tous, Loic  
    Proceedings paper
    2011, 26th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC, 5/09/2011, p.1195-1198
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    Cu pumping in TSVs: Effect of pre-CMP thermal budget

    De Wolf, Ingrid  
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    Croes, Kristof  
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    Varela Pedreira, Olalla  
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    Labie, Riet  
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    Redolfi, Augusto  
    Journal article
    2011, Microelectronics Reliability, (51) 9_11, p.1856-1859
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    Cu-Cu bonding alternative to solder based micro-bumping

    Ruythooren, Wouter  
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    Beltran Amenabar, Amaia
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    Labie, Riet  
    Proceedings paper
    2007, 9th Electronics Packaging Technology Conference - EPTC, 10/12/2007, p.315-318
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    Cu/Sn microbumps interconnect for 3D TSV chip stacking

    Agarwal, Rahul
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    Zhang, Wenqi
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    Limaye, Paresh
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    Labie, Riet  
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    Dimcic, Biljana
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    Phommahaxay, Alain  
    Proceedings paper
    2010, IEEE 60th Electronic Components and Technology Conference - ECTC, 1/06/2010, p.858-863
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    Design issues and cosiderations for low-cost 3D TSV IC technology

    Van der Plas, Geert  
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    Limaye, Paresh
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    Mercha, Abdelkarim  
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    Oprins, Herman  
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    Torregiani, Cristina
    Proceedings paper
    2010, IEEE International Solid-State Circuits Conference - ISSCC, 8/02/2010, p.148-149
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    Detailed structural and electrical characterization of plated crystalline silicon solar cells

    Dang Thi Thuy, Chi  
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    Labie, Riet  
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    Simoen, Eddy  
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    Poortmans, Jef  
    Journal article
    2018-05, Solar Energy Materials and Solar Cells, 184, p.57-66
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    Diffusion growth of Cu3Sn phase in the bump and thin film Cu/Sn structures

    Dimcic, Biljana
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    Labie, Riet  
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    De Messemaeker, Joke  
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    Vanstreels, Kris  
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    Croes, Kristof  
    Journal article
    2012, Microelectronics Reliability, (52) 9_10, p.1971-197
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