Browsing by Author "Lee, Hyebin"

Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET

Metal-Contact Improvement in a Multilayer WSe2 Transistor through Strong Hot Carrier Injection

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation