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Browsing by Author "Lenk, S."

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    Asymmetric strain relaxation in patterned SiGe layer: a means to enhance carrier mobilities in Si cap layers

    Buca, D.
    ;
    Hollander, B.
    ;
    Feste, S.
    ;
    Lenk, S.
    ;
    Trinkaus, H.
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    Mantl, S.
    ;
    Loo, Roger  
    ;
    Caymax, Matty  
    Journal article
    2007-01, Applied Physics Letters, (90) 3, p.32108
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    Formation of ternary Ni-silicide on relaxed and strained SiGe layers

    Zhao, Q.T.
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    Buca, D.
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    Lenk, S.
    ;
    Loo, Roger  
    ;
    Caymax, Matty  
    ;
    Mantl, S.
    Journal article
    2004, Microelectronic Engineering, (76) 1_4, p.285-289
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    Strain relaxation of pseudomorphic Si1-xGex/Si(100) heterostructures by Si+ ion implantation

    Holländer, B.
    ;
    Buca, D.M.
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    Lenk, S.
    ;
    Mantl, S.
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    Herzog, H.J.
    ;
    Hackbarth, T.
    ;
    Loo, Roger  
    ;
    Caymax, Matty  
    Oral presentation
    2004, 14th International Conference on Ion Beam Modification of Materials - IBMM
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    Thin strain relaxed SiGe buffer layers on Si and SOI wafers made by He+ ion implantation and annealing

    Mantl, S.
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    Holländer, B.
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    Hüging, N.
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    Luysberg, M.
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    Lenk, S.
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    Hogg, S.M.
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    Herzog, H.J.
    ;
    Hackbarth, T.
    Meeting abstract
    2003, Abstracts Book ICSI3: 3rd International Conference on SiGe(C) Epitaxy and Heterostructures, 9/03/2003, p.117

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