Browsing by Author "Lenk, S."
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Publication Asymmetric strain relaxation in patterned SiGe layer: a means to enhance carrier mobilities in Si cap layers
Journal article2007-01, Applied Physics Letters, (90) 3, p.32108Publication Formation of ternary Ni-silicide on relaxed and strained SiGe layers
Journal article2004, Microelectronic Engineering, (76) 1_4, p.285-289Publication Strain relaxation of pseudomorphic Si1-xGex/Si(100) heterostructures by Si+ ion implantation
;Holländer, B. ;Buca, D.M. ;Lenk, S. ;Mantl, S. ;Herzog, H.J. ;Hackbarth, T.; Oral presentation2004, 14th International Conference on Ion Beam Modification of Materials - IBMMPublication Thin strain relaxed SiGe buffer layers on Si and SOI wafers made by He+ ion implantation and annealing
;Mantl, S. ;Holländer, B. ;Hüging, N. ;Luysberg, M. ;Lenk, S. ;Hogg, S.M. ;Herzog, H.J.Hackbarth, T.Meeting abstract2003, Abstracts Book ICSI3: 3rd International Conference on SiGe(C) Epitaxy and Heterostructures, 9/03/2003, p.117