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Browsing by Author "Leroux, P."

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    A 1.3dB NF CMOS LNA for GPS with 3kV HBM ESD-protection

    Leroux, P.
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    Steyaert, M.
    ;
    Vassilev, Vesselin
    ;
    Groeseneken, Guido  
    Proceedings paper
    2002-09, Proceedings European Solid-State Circuit Conference - ESSCIRC, 23/09/2002, p.335-338
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    A 1.6dB NF CMOS LNA for GPS with 3kV HBM ESD-protection

    Leroux, P.
    ;
    Steyaert, M.
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    Vassilev, Vesselin
    ;
    Groeseneken, Guido  
    Proceedings paper
    2002, Proceedings 24th EOS/ESD Symposium, 6/10/2002, p.18-25
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    Co-design methodology to provide high esd protection levels in the advanced rf circuits

    Vassilev, Vesselin
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    Thijs, Steven  
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    Lajo-Segura, P.
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    Groeseneken, Guido  
    ;
    Wambacq, Piet  
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    Leroux, P.
    Proceedings paper
    2003-09, Proceedings EOS/ESD Symposium, 21/09/2003, p.195-203
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    Effect of airgap deep trench isolation on the gamma radiation behavior of a 0.13 μm SiGe:C NPN HBT technology

    Put, Sofie
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    Simoen, Eddy  
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    Van Huylenbroeck, Stefaan  
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    Claeys, Cor
    ;
    Van Uffelen, Nick
    ;
    Leroux, P.
    Proceedings paper
    2008, 8th European Workshop on Radiation Effects on Components and Systems - RADECS, 10/09/2008, p.426-431
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    Effect of rotation, gate-dielectric and SEG on the noise

    Put, Sofie
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    Mehta, Harsh
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    Collaert, Nadine  
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    Van Uffelen, M.
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    Leroux, P.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2009, 5th EUROSOI Workshop, 19/01/2009, p.123-124
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    Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs

    Put, Sofie
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    Mehta, H.
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    Collaert, Nadine  
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    Van Uffelen, M.
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    Leroux, P.
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    Claeys, Cor
    ;
    Lukyanchikova, N.
    Journal article
    2010, Solid-State Electronics, (54) 2, p.178-184
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    Geometry and strain dependence of the proton radiation behavior of MuGFET devices

    Put, Sofie
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    Simoen, Eddy  
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    Collaert, Nadine  
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    Claeys, Cor
    ;
    Van Uffelen, M.
    ;
    Leroux, P.
    Journal article
    2007, IEEE Trans. Nuclear Science, (54) 6, p.2227-2232
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    High ESD performance, low power CMOS LNS for GPS applications

    Leroux, P.
    ;
    Vassilev, Vesselin
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    Steyaert, M.
    ;
    Maes, Herman
    Journal article
    2003, Journal of Electrostatics, (59) 3_4, p.179-192
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    In-situ recovery of the base current of SiGe NPN HBTs at high gamma dose levels

    Put, Sofie
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    Simoen, Eddy  
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    Van Huylenbroeck, Stefaan  
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    Claeys, Cor
    ;
    Van Uffelen, M.
    ;
    Leroux, P.
    Proceedings paper
    2007, Workshop on Semiconductor Advances for Future Electronics and Sensors - SAFE, 29/11/2007, p.452-456
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    Low-frequency noise analysis of g-irradiated p-channel bulk MuGFETs

    Simoen, Eddy  
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    Put, Sofie
    ;
    Leroux, P.
    ;
    Van Uffelen, M.
    ;
    Jurczak, Gosia  
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    Claeys, Cor
    Proceedings paper
    2010, 11th International Conference on Ultimate Integration on Silicon - ULIS, 18/03/2010, p.25-28
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    Radiation damage studies of strain-engineered and high-mobility deep submicrometer MOSFETs

    Simoen, Eddy  
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    Put, Sofie
    ;
    Van Uffelen, Nick
    ;
    Leroux, P.
    ;
    Claeys, Cor
    ;
    Ohyama, H.
    ;
    Kulkarni, R.
    Oral presentation
    2008, 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications

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