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Browsing by Author "Li, Y."

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    12-EUV layer Surrounding Gate Transistor (SGT) for vertical 6-T SRAM: 5-nm-class technology for ultra-density logic devices

    Kim, Min-Soo  
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    Harada, N.
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    Kikuchi, Yoshiaki  
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    Boemmels, Juergen  
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    Mitard, Jerome  
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    Huynh Bao, Trong
    Proceedings paper
    2019, 2019 Symposium on VLSI Technology, 9/06/2019, p.T15-1
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    Advances in Magnetics Roadmap on Spin-Wave Computing

    Chumak, A. V.
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    Kabos, P.
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    Wu, M.
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    Abert, C.
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    Adelmann, Christoph  
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    Adeyeye, A. O.
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    Akerman, J.
    Journal article
    2022, IEEE TRANSACTIONS ON MAGNETICS, (58) 6, p.0800172
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    An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

    Zhou, L.
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    Bo, T.
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    Ji, Z.
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    Yang, H.
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    Xu, H.
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    Liu, Q.
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    Simoen, Eddy  
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    Wang, X.
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    Ma, X.
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    Li, Y.
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    Yin, H.
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    Du, A.
    Journal article
    2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.92-96
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    CMP process development for high mobility channel materials

    Ong, Patrick  
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    Gillot, C.
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    Ansar, S.
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    Noller, B.
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    Li, Y.
    Proceedings paper
    2012, International Conference on Planarization/CMP Technology - ICPT, 15/10/2012
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    Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs

    Zhou, L.
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    Liu, Q.
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    Yang, H.
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    Ji, Z.
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    Xu, H.
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    Tang, B.
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    Simoen, Eddy  
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    Jiang, H.
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    Luo, Y.
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    Wang, X.
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    Ma, X.
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    Li, Y.
    Journal article
    2020, IEEE Transactions on Device and Materials Reliability, (20) 3, p.498-505
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    Interconnects for scaled SRAM with vertical Surrounded Gate Transistors (SGT)

    Boemmels, Juergen  
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    Harada, N.
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    Kim, Min-Soo  
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    Mitard, Jerome  
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    Kikuchi, Yoshiaki  
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    Li, Waikin  
    Proceedings paper
    2019, IEEE International Interconnect Technology Conference (IITC 2019) and Materials for Advanced Metallization Conference (MAM 2019), 3/06/2019, p.2.5
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    LPCVD polysilicon-based passivating contacts for plated bifacial n-type PERT solar cells

    Recaman Payo, Maria  
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    Russell, Richard
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    Singh, Sukhvinder  
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    Depauw, Valerie  
    Meeting abstract
    2018, 35th European Photovoltaic Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC, 24/09/2018, p.2CO.10.4
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    Reflectionless grating coupling for silicon-on-insulator integrated circuits

    Vermeulen, Diedrik
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    De Koninck, Yannick  
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    Li, Y.
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    Lambert, Emmanuel
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    Bogaerts, Wim  
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    Baets, Roel  
    Proceedings paper
    2011, 8th International Conference in Group IV Photonics, 14/09/2011, p.74-75
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    Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

    Zhou, L.
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    Zhang, Q.
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    Yang, H.
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    Ji, Z.
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    Zhang, Z.
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    Liu, Q.
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    Xu, H.
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    Tang, B.
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    Simoen, Eddy  
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    Ma, X.
    ;
    Wang, X.
    Journal article
    2020, IEEE Electron Device Letters, (41) 7, p.965-968

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